At-speed scan testing can be achieved for speeds in excess of 1 GHz.Inventores Sang Hoo Dhong , Harm Peter Hofstee , Kevin John Nowka , Joel Abraham SilbermanUS6014763 * Jan 15, 1998 Jan 11, 2000 International Business Machines Corporation At-speed scan testing...
A scan cell architecture for inter-clock at-speed delay testing network in such ICs is that it can lead to high power supply noise (PSN) during the capture cycles in at-speed scan testing for transition delay ... KY Cho,R Srinivasan - Vlsi Test Symposium 被引量: 0发表: 2011年 An Eff...
Method for at-speed testing of memory interface using scan.A method and a circuit of testing of a memory interface associated with an embedded memory in a ... B Nadeaudostie 被引量: 0发表: 0年 Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Sp...
在at—speed模式下受scan_enable控制输出Scan-clk和launch、capture两个脉冲。此时只要把示意图中的testmode信号分解为at.._speedjestmode和stuck-at-testmode两种模式,用来选中所需的scan_clk和Atspeed clk即可。 4 结论 以上描述了基于扫描的at—speed测试的机理以及如何用一种OCC电路实现at—speed测试时钟产生,以及...
scan chain的原理和实现——8.AT SPEED Test & OCC AT SPEED Test last_shift launch mode (低速测试) system_clock launch mode ( launch on capture) 1.at speed test structure and OCC Controller 2.OCC Controller 当使用set_dft_configuration -clock_controller enable运行insert_dft...
MBIST is memory build-in self test,it run selected algrithm to find defects on cells in memory;stuck-at and scan tests cehck physical faults based on fault model;transition test is also called scan delay or at-speed scan test which check transiiton delay on scan chain path....
Double-capture技术是另一种at-speed test的技术,是一种true at-speed test,可以测试所有的intra-clock-domain和inter-clock-domain的structural faults和delay faults,无论是在synchronous 或asynchronous design。并且scan enable比较容易physical implementation,scan/ATPG也容易实现。
它的物理实现是采用180nm Hejian标准单元库工艺,最终面积为12.5mm×12.5mm,芯片规模为1.1M标准单元,Memory单元总计为432KB.芯片设计频率为156.25MHz,采用DDR通信端口,最终功耗为4.7W.在这款芯片中采用了At-speed测试,可以对芯片的时延故障进行测试,以提高芯片的可靠性.文章中针对At-speed测试的逻辑实现,以及在物理...
aThe weight and the volume may ignore 重量和容量也许忽略[translate] aScan Speed: Drive through imaging at speed of approximately 4kph 扫瞄速度: 通过想象驾驶以近似地4kph的速度[translate]
faulttransitionspeedtesting故障检测scan 1 At-SpeedTransitionFaultTestingWithLowSpeedScanEnable NisarAhmed,C.P.Ravikumar ASICProductDevelopmentCenter TexasInstrumentsIndia Bangalore-560093 n-ahmed2,ravikumar@ti MohammadTehranipoor,JimPlusquellic Dept.ofComputerScienceandElectricalEng. UniversityofMarylandBaltimoreCount...