At-speed scan testing can be achieved for speeds in excess of 1 GHz.Inventores Sang Hoo Dhong , Harm Peter Hofstee , Kevin John Nowka , Joel Abraham SilbermanUS6014763 * Jan 15, 1998 Jan 11, 2000 International Business Machines Corporation At-speed scan testing...
High-quality at-speed scan testing, characterized by high small-delay-defect detecting capability, is indispensable to achieve high delay test quality for DSM circuits. However, such testing is susceptible to yield loss due to excessive ... WEN,X. - 《Proc Intl Test Conf》 被引量: 83发表:...
在at—speed模式下受scan_enable控制输出Scan-clk和launch、capture两个脉冲。此时只要把示意图中的testmode信号分解为at.._speedjestmode和stuck-at-testmode两种模式,用来选中所需的scan_clk和Atspeed clk即可。 4 结论 以上描述了基于扫描的at—speed测试的机理以及如何用一种OCC电路实现at—speed测试时钟产生,以及...
Lessons from at-speed scan deployment on an Intel® Itanium® microprocessor 来自 Semantic Scholar 喜欢 0 阅读量: 15 作者:Pankaj Pant,Joshua Zelman,Glenn Colon-Bonet,Jennifer Flint,Steve Yurash 摘要: Lessons learnt during the deployment of transition scan content on an Intel&#x...
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SUMMARY In this paper, we provide a practical formulation of the problem of identifying all error occurrences and all failed scan cells in atspeed scan based BIST environment. We propose a method that can be used to identify every error when the circuit test frequency is higher than the tester...
MBIST is memory build-in self test,it run selected algrithm to find defects on cells in memory;stuck-at and scan tests cehck physical faults based on fault model;transition test is also called scan delay or at-speed scan test which check transiiton delay on scan chain path....
Jul 6 19:32:26 myUbuntu kernel: [ 1613.716000] usb 1-2: new fullspeed USB device using uhci_hcd and address 4 Jul 6 19:32:26 myUbuntu kernel: [ 1613.884000] usb 1-2: configuration #1 chosen from 1 choice Jul 6 19:32:26 myUbuntu kernel: [ 1614.328000] cdc_acm 1-2:1.8: ttyAC...
aThe weight and the volume may ignore 重量和容量也许忽略[translate] aScan Speed: Drive through imaging at speed of approximately 4kph 扫瞄速度: 通过想象驾驶以近似地4kph的速度[translate]
scan chain的原理和实现——8.AT SPEED Test & OCC AT SPEED Test last_shift launch mode (低速测试) system_clock launch mode ( launch on capture) 1.at speed test structure and OCC Controller 2.OCC Controller 当使用set_dft_configuration -clock_controller enable运行insert_dft...