At-speed scan testing can be achieved for speeds in excess of 1 GHz.Inventores Sang Hoo Dhong , Harm Peter Hofstee , Kevin John Nowka , Joel Abraham SilbermanUS6014763 * 1998年1月15日 2000年1月11日 International Business Machines Corporation At-speed scan testing...
3.scanmasterclock & masterclock 对于多路复用触发器(Mux-D),ScanClock的信号“type”是用于指定ScanMasterClock(扫描移位时钟)和MasterClock(捕获时钟)。 用于Mux-D扫描设计,同一时钟通常用于移位和捕获。 当定义了Scanclock并report_dft_signal,将同时看到ScanMasterClock和MasterClock属性。 set_dft_signal -view exis...
At-speed scan testing 优质文献 相似文献 参考文献 引证文献Low-capture-power test generation for scan-based at-speed testing Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being sev... NX Wen,Y ...
Test patterns for at-speed scan tests are generated by filling unspecified bits of test cubes with functional background data. Functional background data are scan cell values observed when switching activity of the circuit under test is near a steady state. Hardware implementations in EDT (embedded...
在正常工作模式(Test—mode=0)下要输出Func_clk。在at—speed模式下受scan_enable控制输出Scan-clk和launch、capture两个脉冲。此时只要把示意图中的testmode信号分解为at.._speedjestmode和stuck-at-testmode两种模式,用来选中所需的scan_clk和Atspeed clk即可。
Double-capture技术是另一种at-speed test的技术,是一种true at-speed test,可以测试所有的intra-clock-domain和inter-clock-domain的structural faults和delay faults,无论是在synchronous 或asynchronous design。并且scan enable比较容易physical implementation,scan/ATPG也容易实现。
图1是一个at-speed测试的例子。At-speed 测试在单元B和单元C间进行。在shift阶段(scan _enable=1)使用测试机提供的慢速时钟,A和B分别装载0和1。然后电路回到功能模式(scan_ena2ble=0)。这时发一个功能时钟(launch时钟 ) , B 会在 D 端捕获 0,一个 1 - to - 0 的翻转会传递到 C。 在第二个功能时...
Lessons from at-speed scan deployment on an Intel® Itanium® microprocessor 来自 掌桥科研 喜欢 0 阅读量: 29 作者:Pankaj Pant,Joshua Zelman,Glenn Colon-Bonet,Jennifer Flint,Steve Yurash 摘要: Lessons learnt during the deployment of transition scan content on an Intel®...
MBIST is memory build-in self test,it run selected algrithm to find defects on cells in memory;stuck-at and scan tests cehck physical faults based on fault model;transition test is also called scan delay or at-speed scan test which check transiiton delay on scan chain path....
Jul 6 19:32:26 myUbuntu kernel: [ 1613.716000] usb 1-2: new fullspeed USB device using uhci_hcd and address 4 Jul 6 19:32:26 myUbuntu kernel: [ 1613.884000] usb 1-2: configuration #1 chosen from 1 choice Jul 6 19:32:26 myUbuntu kernel: [ 1614.328000] cdc_acm 1-2:1.8: ttyAC...