Communications take place at a speed of the tester clock signal, but the scan operates at the full operational speed of the device under test. At-speed scan testing can be achieved for speeds in excess of 1 GHz.Inventores Sang Hoo Dhong , Harm Peter Hofstee , Kevin John Nowka , Joel ...
Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing At-speed scan testing, based on ATPG and ATE, is indispensable to guarantee timing-related test quality in the DSM era. However, at-speed scan testing may ... Xiaoqing,Wen,Kohei,... - 《Journal ...
2.5 Definition of at-speed scan test In contrast to running the chip at application speed, at- speed testing means that the time between launch event and capture event is one application period apart (see Fig. 7 in Section 5). The clock period of the test program does not necessarily ...
在at—speed模式下受scan_enable控制输出Scan-clk和launch、capture两个脉冲。此时只要把示意图中的testmode信号分解为at.._speedjestmode和stuck-at-testmode两种模式,用来选中所需的scan_clk和Atspeed clk即可。 4 结论 以上描述了基于扫描的at—speed测试的机理以及如何用一种OCC电路实现at—speed测试时钟产生,以及...
At-Speed_Test_FastScan_TestKompress 下载积分:700 内容提示: At-Speed Test - FastScanand TestKompressTSMC Reference Flow Release 6.0 文档格式:PDF | 页数:10 | 浏览次数:89 | 上传日期:2012-04-18 16:51:57 | 文档星级: At-Speed Test - FastScanand TestKompressTSMC Reference Flow Release 6.0...
scan chain的原理和实现——8.AT SPEED Test & OCC AT SPEED Test last_shift launch mode (低速测试) system_clock launch mode ( launch on capture) 1.at speed test structure and OCC Controller 2.OCC Controller 当使用set_dft_configuration -clock_controller enable运行insert_dft...
MBIST is memory build-in self test,it run selected algrithm to find defects on cells in memory;stuck-at and scan tests cehck physical faults based on fault model;transition test is also called scan delay or at-speed scan test which check transiiton delay on scan chain path....
而有关测试信号 (scan_enable, test clock 等)所用的 IO, 则需用满足一定的性能要求. 片上存储器的测试 片上的存储器用 BIST 方式测试, 采用 Mentor 公司提供的 MBISTArchitect 同样可以做”at-speed”测试. 对于存储器周围的影子逻辑, 在扫描测试时, 存储器的”wrapper”起作用. 如下图, 存储器的输入信号...
dat--speedfunctionaltestingforthesamereasonsthatstuck——atSCantestingreplacedfunctionaltesting.Andat—speedtestforbothlogicandmemoryisbecomingarequirementtoensureacceptableDPMrates.Thispaperdiscussesthemethodologyofat—speedandtheclockgenerationcircuitsupportingat—speedtest——OCCcircuit.Keywords:At—speedtest;OCC;test...
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