AEC - Q100-004 - REV-D August 7, 2012 Automotive Electronics Council Component Technical Committee ATTACHMENT 4 AEC - Q100-004 REV-D IC LATCH-UP TEST AEC - Q100-004 - REV-D August 7, 2012 Automotive Electronics Council Component Technical Committee Acknowledgment Any document involving a ...
AEC-Q1-4D是汽车电子委员会(AEC)为确保汽车行业集成电路(IC)安全性和可靠性的关键标准,专注于针对闩锁效应的测试。它于212年发布,由多家知名半导体公司的专家合作制定,以应对由于静电放电可能导致的CMOS器件破坏问题。该标准涵盖测试目的、方法、条件、结果分析以及
AEC_Q100-004_rev_C AEC - Q100-004 - REV-C October 8, 1998 Automotive Electronics Council Component Technical Committee ATTACHMENT 4 AEC - Q100-004 REV-C IC LATCH-UP TEST
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AEC - Q100-004 - REV-D August 7, 2012 Automotive Electronics Council Component Technical Committee ATTACHMENT 4 AEC - Q100-004 REV-D IC LATCH-UP TEST AEC - Q100-004 - REV-D August 7, 2012 Automotive Electronics Council Component Technical Committee Acknowledgment Any document involving a ...