AEC - Q100-008 - REV-A July 18, 2003 Component Technical CommitteeAutomotive Electronics Council ATTACHMENT 8 AEC - Q1 00-008 REV-A EARLY LIFE FAILURE RATE (ELFR)
TEST before and after HTOL at room, cold and hot temperature (in that order). 需求确认:需客户提供客户提供HTOL参考原理图或者设计需求、芯片POD、具体试验条件、试验样品数量、硬件需求数量、 HTOL条件下单颗芯片预计功耗等。 Early Life Failure Rate(ELFR) 参考标准:AEC Q100-008; 目的:评估工艺的稳定性,...
AEC - Q100-008 - REV-A July 18, 2003 Automotive Electronics Council Component Technical Committee ATTACHMENT 8 AEC - Q100-008 REV-A EARLY LIFE FAILURE RATE (ELFR) AEC - Q100-008 - REV-A July 18, 2003 Automotive Electronics Council Component Technical Committee Acknowledgment Any document ...
AEC_Q100-008_rev_A AEC - Q100-008 - REV-A July 18, 2003 Automotive Electronics Council Component Technical Committee ATTACHMENT 8 AEC - Q100-008 REV-A EARLY LIFE FAILURE RATE (ELFR)
AEC-Q100-008-REV-A July18,2003 ComponentTechnicalCommittee AutomotiveElectronicsCouncil ChangeNotification ThefollowingsummarydetailsthechangesincorporatedintoAEC-Q100-008Rev-A: •AllSections:Minorrevisionsmadetoallsectionstocorrectformattingerrors. •Section3.2:Addedoperatingtemperaturegrades(0through4). ...
AEC_Q100-008A早期生命失败率(elfr).docx,July 18, 2003 July 18, 2003 AEC - Q100-008 - REV-A Automotive Electronics Council Component Technical Committee ATTACHMENT 8 AEC - Q100-008 REV-A EARLY LIFE FAILURE RATE (ELFR) July 18, 2003 July 18, 2003 AEC - Q100
AEC-Q100-008-REV-AJuly18,2003 ChangeNotification ThefollowingsummarydetailsthechangesincorporatedintoAEC-Q100-008Rev-A: •AllSections:Minorrevisionsmadetoallsectionstocorrectformattingerrors. •Section3.2:Addedoperatingtemperaturegrades(0through4).AutomotiveElectronicsCouncilComponentTechnicalCommittee ...