out-of-plane指的就是晶格ab面外的xrd图像，这是用于检测多层膜三明治结构的物质
如何用XRD测量薄膜的in-plane的晶格常数，在坛子里搜里一下貌似要用小角的非对称扫描测量，但是具体操作...
高精度薄膜測定功能: X光反射率, Rocking-Curve, in plane XRD, 倒置格點量測, GIXRD, GISAXS, XRT 獨家偵測器球面五軸運動In-Plane光學系統無需重新校正光路 多用途: 粉末, 薄膜, 固態材料, 小角散射量測, 極圖量測, 微區繞射, 2D SAXS, 2D WAXS, etc. Rigaku Automate X光繞射殘留應力分析專用儀 新型...
Integrating Signal Processing and AD Conversion in one Focal-Plane Mounted ASIC(在一个焦平面安装的ASIC中集成信号处理和AD转换) 在平面中描述立体--透视详解(Describe the stereo in the plane - Perspective) 平面构成因素在室内设计中的应用(The application of plane composition factors in interior design...
structure, such as preferred orientation (or texture), orientational relationship and lattice distortion between an epitaxial film and its substrate, crystallite-size anisotropy, etc, can be obtained from both in-plane and out-of-plane XRD measurements (see the second review of this series(2)). ...
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As-grown MgB 2 thin films were deposited on r-plane (1 1 2) and c-plane (0 0 1) sapphire substrates by using a carrousel-type magnetron sputtering system. Even though the respective critical temperature and residual-resistivity ratio of the MgB 2 films deposited on r- and c-plane ...
K.AbePHYSICA CA. Saito, H. Shimakage, A. Kawakami, Z. Wang, K. Kuroda, H. Abe, M. Naito, W. J. Moon, K. Kaneko, M. Mukaida, S. Ohshima, XRD and TEM studies of as-grown MgB2 thin films deposited on r- and c-plane sapphire substrates, Physica C, vol. 412- 414, Part...