XPS spectra of clean TiO 2 resulting from scraping in vacuum indicate that oxygens terminate at the very surface. Implications of these observations are discussed.doi:10.1016/0009-2614(79)87231-0T.K. ShamM.S. LazarusElsevier B.V.Chemical Physics Letters...
Fig.2-11UV-vis DRS Spectraof{001}-0.1%Fe-AHSs (a),{001}-0.2%Fe-AHSs (b)and{001}-AHSs (c) Inset: The Plotsof (αhν)2versushνfor Bandgap Energies) 图2-11为Fe掺杂锐钛矿型{001}-TiO2纳米片多级球催化剂的紫外-可见固体漫反射光谱图。由图2-11可以看到,3种催化剂在低波(200 nm-40...
Fig.2-11UV-vis DRS Spectraof{001}%Fe-AHSs (a),{001}%Fe-AHSs (b)and{001}-AHSs (c) Inset: The Plotsof (αhν)2versushνfor Bandgap Energies) 图2-11为Fe掺杂锐钛矿型{001}-TiO2纳米片多级球催化剂的紫外-可见固体漫反射光谱图。由图2-11可以看到,3种催化剂在低波(200 nm-400 nm)紫...
9 C. D. Wagner, Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Corporation, 1979). 10 XPSSurfA Online collaborative surface analysis database, see:https://cmsshub.latrobe.edu.au/xpsdatabase/spectra/view_many. 11 XPS Simplified. Thermo Scientific XPS website athttp://www.xpssimpli...
s轨道的XPS谱图用于表征TiO2主体及掺杂的Fe原子与.doc,Ti 2p轨道和O 1s轨道的XPS谱图用于表征TiO2主体及掺杂的Fe原子与主体TiO2间的化学相互作用,具体数据见表2-5。其中,由Ti 2p轨道(图3-9B)的XPS谱图可以看到,{001}-0.1%Fe-AHSs和{001}-AHSs于结合能458.9 eV和464.6 e
spectroscopy: a reference book of standard spectra for identification and interpretation of XPS data....
Fig.2-11UV-vis DRS Spectraof{001}-0.1%Fe-AHSs (a),{001}-0.2%Fe-AHSs (b)and{001}-AHSs (c) Inset: The Plotsof (αhν)2versushνfor Bandgap Energies) 图2-11为Fe掺杂锐钛矿型{001}-TiO2纳米片多级球催化剂的紫外-可见固体漫反射光谱图。由图2-11可以看到,3种催化剂在低波(200 nm-40...
通过计算TiO2（200）晶⾯得到的D200近似为晶体的粒径⼤⼩。由表2-2可以看到，相⽐于未掺杂Fe元素的催化剂{001}-AHSs 的粒径尺⼨D200为16.5 nm，经过微量Fe元素的掺杂后，催化剂{001}-0.1%Fe-AHSs和{001}-0.2%Fe-AHSs 的D200均明显减⼩，分别为10.9 nm和13.9 nm。D200减⼩的现象说明此时...
12 Surface Science Spectra (SSS), Spectral data for XPS, AES, and SIMS. An official journal of the American Vacuum Society (AVS), see: https://avs.scitation.org/journal/sss. 表2 钛 2p3/2 轨道的几种钛化学态结合能 No.1 注意事项 ...
XPS表征手册一般采用:Chastain, Jill, andRoger C. King, eds. Handbook of X-ray photoelectron spectroscopy: a reference book of standard spectra for identification and interpretation of XPS data. Eden Prairie, MN: Physical Electronics, 1995.