02 在大气环境下,磨损表面产生的FeO和Fe2O3氧化物,其对接触界面具有很好的润滑保护作用,从而表现出较低的磨损量;而真空环境下随位移幅值的增加,因Fe2O3消失,FeO含量逐渐减少及更多单质Fe暴露导致磨损量快速增加。 04 前景与应用 本论文...
In the case of air-exposed marcasite (FeS2), no satellite feature is observed since the Fe2+ is in a low-spin configuration. The broad structure to higher binding energy (~710.5eV) of the main Fe2p3/2 peak is NOT satellite structure but is due to Fe3+ states from oxidati...
图1 Fe 2p XPS spectrum of S-LFP and R-LFP-Li2DHBN 常见问题1:为什么是选择Fe的2p轨道来分析峰位和峰形? 首先,对于一个化学成分未知的样品,一般会做一个全谱扫描(相对应的上图是窄区扫描,窄区扫描主要针对某一个特定的元素的强谱线进行扫描,扫描的Binding Energy能量范围较窄,例如上图Fe 2p从700~740e...
显然样品 NFM@0.66% Mo 的表面存在 Mo 元素富集的现象，所以导致 Fe 元素含量变少。这说明 Mo 元素如预期设想的那样，是在表面掺杂。 利用非原位 XPS 谱图研究了共掺杂电极材料 FF-NMO0.10 （Fe\F共掺杂）充放电过程中的电荷补偿机理。初始样品中所有的 Fe3+位于 711.99 eV，Fe2p3/2 的峰为 706.7 ...
Analysis of XPS spectra of Fe2and Fe3ions in oxide materials Toru Yamashita, Peter Hayes Pyrometallurgy Research Centre,
2014,116, 213911一文中,采用XPS全谱分析来对比AlN和AlN:Er,证实reactive magnetron sputtering处理后,Er成功掺杂到AlN薄膜中。 实例说明六:Appl. Catal. B: Environ. 2009, 595–602.一文中采用XPS全谱分析来说明Fe成功掺杂到TiO2 nanorod中。 从以上两个例子中可以看出,全谱分析主要看峰的有无,进而确定是否...
Fe2p and Fe3s XPS spectra of more than ten kinds of ferrous compounds were collected. The characteristics about their positions and shapes of peaks were studied. The results show that the analysis of shapes of Fe2p and Fe3s spectra as well as positions of peaks can give abundant information ...
2 2 3 Using these parameters, the Fe 3p peaks of Fe3O4 and Fe1yO are analysed. The results indicate that high resolution XPS techniques can be used to determine the Fe2+/Fe3+ ratios in metal oxides. The technique has the potential for application to other transition metal oxide systems....
XPS study of the valence band spectrum of amorphous Fe-B alloys XPS spectra of Fe 3s and Fe 3p levels and Fe 3d valence band of amorphous iron-boron alloys were measured as a function of boron concentration over the ran... M.,Matsuura,and,... - 《Solid State Communications》 被引量:...
XPS表征手册一般采用:Chastain, Jill, andRoger C. King, eds. Handbook of X-ray photoelectron spectroscopy: a reference book of standard spectra for identification and interpretation of XPS data. Eden Prairie, MN: Physical Electronics, 1995.