本文档的读者应该至少熟悉标准IEEE1149.1和1149.6。1149.x一词在本文档中指的是IEEE1149.x(JTAG)边界扫描标准,JTAG器件是指实现JTAG边界扫描,并完全符合这些标准的器件,而非JTAG器件是那些不能实现JTAG边界扫描的器件。 指定和使用JTAG器件 XJTAG虽然能够测试JTAG器件和非JTAG器件之间的连接,为获得更大的覆盖范围,应尽...
用JTAG器件环绕非JTAG逻辑器件集群可以控制集群的所有输入和监控集群的所有输出。尝试确保在集群内有足够的访问节点以尽可能充分地进行测试集群的运行。如有必要,添加额外的JTAG连接,以获得所需的群集节点。或者,将逻辑系统放入支持边界扫描的可编程逻辑器件中或许更好。 通过接口扩展1149.x测试 如果额外的可访问的1149....
This paper presents a DFT(design for test) solution which combines boundary-scan and full-scan together in SoC testability design.Using this method,full sc... XX Wang,LP Liang,XJ Wang - IEEE 被引量: 6发表: 0年 Platform Flash XCFP PROMs Updating Using JTAG Boundary-Scan This paper demonst...
电路板在系统寿命期测试电子行业中,已经能够很好地应用IEEE11409.1边界扫描(JTAG)测试单块电路板卡.它还被较早采用的公司扩展到了多电路板(系统)测试(见图1),但是现在有明显的迹象表明,其他更多主流的公司正在开始对在系统全寿命期内最大限度提高边界扫描技术的使用充满兴趣.Dr. R G Bennetts DFT无电子产品世界...
沈爱华目前担任南通市华通脚手架有限公司、南通市电站阀门工程配套有限公司法定代表人,同时在3家企业担任高管,包括担任南通市华通脚手架有限公司执行董事兼总经理,南通市电站阀门工程配套有限公司执行董事兼总经理;二、沈爱华投资情况:沈爱华目前是南通市华通脚手架有限公司直接控股股东,持股比例为51.25%,是南通加罗舞台设备...
DFT 可测试性设计(Design for Testability) EEPROM 電子抹除式可複寫唯讀記憶體(Electrically Erasable Programmable Read Only Memory) FPGA 現場可编程逻辑閘阵列(Field Programmable Gate Array) IEEE 電機電子工程師學會(Institute of Electrical and Electronics Engineers) 1149.1 IEEE Standard 1149.x:1149.1: Test ...
DFT 可测试性设计(Design for Testability) EEPROM 電子抹除式可複寫唯讀記憶體(Electrically Erasable Programmable Read Only Memory) FPGA 現場可编程逻辑閘阵列(Field Programmable Gate Array) IEEE 電機電子工程師學會(Institute of Electrical and Electronics Engineers) 1149.1 IEEE Standard 1149.x:1149.1: Test ...
XJTAG DFT Assistant helps to validate correct JTAG chain connectivity, while displaying boundary scan access and coverage onto the schematic diagram through full integration with CR-8000 Design Gateway. Simon Payne, CEO of XJTAG, says: “XJTAG is pleased to be a part of Zuken’s solution ecosy...
.NET API1149.6BOMCheckChainConnection TestDebuggingDFTElectronicsFPGAI2CIntegrationJTAG Chain DebuggerLabVIEWLayout ViewerLibrariesLibraryNetlistPCOLA/SOQProject setupRevisionsSupportTerminationTest Coveragev3.3v3.4v3.5v3.6v3.7v3.8v3.9v3.10v3.11v3.12v3.13v4.0VariantsWaveform ViewerXJAnalyserXJDeveloperXJEaseXJFlash...
Test summary report XJTAG 3.7 offers a new report (via the DFT analysis screen). In addition to summarising test coverage, it shows the tests to be run on your design and explains briefly what each test covers. To work with this new feature an update to the XJEase library has also been...