1英语翻译The X-ray diffraction (XRD) patterns were recordedon a X-ray power diffractometer using Cu Ka radiation(0.15418 nm) (PANalytical Co.X’pert PRO,Netherlands) operated under a voltage of 40 kV and acurrent of 40 mA. 2TheX-raydiffraction (XRD) patternswererecordedonaX-raypowerdiffracto...
粉末X光衍射(XRD)样式获取了on与CuK¦Á辐射的一个Simens D5005衍射计.N2 isotherm尽快被记录了使用Micromeritics2010用具; 样品是醉的在523 K 2 h 的before测量.比表面区域是故意的by赌注模型; 毛孔大小分布被计算了by从吸附的Barrett¨CJoyner¨CHalenda惯例isotherm.红外光谱在与Nicolet冲击的空气被记录了410分...
aX-ray diffraction (XRD) pattern were recorded with Brucker D8 Advanced X-ray diffraction measurement system, with Cu Kα source (λ=1.54A) X-射线衍射(XRD)样式记录了与Brucker D8先进的X-射线衍射测量系统,以Cu Kα来源(λ=1.54A)[translate]...
X-ray diffraction (XRD) patterns of the unmodified and modified biochars.Ling ZhaoXinde CaoWei ZhengYue Kan
aUseful volume (L) 416 60.0 10.5 60.0 有用的容量(L) 416 60.0 10.5 60.0[translate] aSeparate to 分离[translate] aThe powder X-ray diffraction(XRD)patterns of the samples 样品的粉末X-射线衍射(XRD)样式[translate]
求翻译:X-ray diffraction (XRD) patterns and transmission electron microscopy (TEM) micrograph were used to是什么意思?待解决 悬赏分:1 - 离问题结束还有 X-ray diffraction (XRD) patterns and transmission electron microscopy (TEM) micrograph were used to...
When a sample’s X-ray diffraction pattern (XRD) is measured, the corresponding crystal structure is usually determined by searching for similar XRD patterns in the database. However, if a similar XRD pattern is not found, it is tremendously laborious to identify the crystal structure even for...
How to plot XRD data in origin - From machine data to a publishable graph benladun 96 0 High-temperature X-ray diffraction - a powerful technique to analyze your sample benladun 48 0 ECTMR2020- Elements of X-ray diffraction-Dr. Rakesh Mishra benladun 19 0 ...
In addition, please read our application note, High Resolution X-Ray Diffraction (HR-XRD) Measurement of Compound Semiconductors, for a discussion of how this method may be used to determine composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, and other materials. In...
X-ray diffraction analysis (XRD), is designed to identify material crystal structure, crystal orientation, and grains size of nanometer crystal, as well as residual stress analysis of mono- and poly-crystalline film material by pairing the X-ray diffraction pattern of crystal against databases in ...