1英语翻译The X-ray diffraction (XRD) patterns were recordedon a X-ray power diffractometer using Cu Ka radiation(0.15418 nm) (PANalytical Co.X’pert PRO,Netherlands) operated under a voltage of 40 kV and acurrent of 40 mA. 2TheX-raydiffraction (XRD) patternswererecordedonaX-raypowerdiffracto...
The powder X-ray diffraction (XRD) patterns were acquiredon a Simens D5005 diffractometer with CuKα radiation.Theisotherm of N2 was recorded using a Micromeritics ASAP2010 apparatus; the samples were out-gassed at 523 K for 2 hbefore the measurement.Specific surface areas were calculated...
求翻译:X-ray diffraction (XRD) patterns of the films were carried out with Cu K? radiation using a diffractometer.是什么意思?待解决 悬赏分:1 - 离问题结束还有 X-ray diffraction (XRD) patterns of the films were carried out with Cu K? radiation using a diffractometer.问题补充:匿名 2013-05...
aUseful volume (L) 416 60.0 10.5 60.0 有用的容量(L) 416 60.0 10.5 60.0[translate] aSeparate to 分离[translate] aThe powder X-ray diffraction(XRD)patterns of the samples 样品的粉末X-射线衍射(XRD)样式[translate]
Moeck, Peter. "X‐ray Diffraction (XRD)" XRD. Portland State University, 31 Mar. 2004. Web. 20 Apr. 2014.X-ray diffraction (XRD) ... 36X-ray diffraction (XRD) ... 41 3) High resolution transmission electron microscopy study of clay mineral particles...
X-Ray Diffraction (XRD) Home»Our Techniques»Spectroscopy»XRD X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials.It provides information on crystal structure, phase, preferred crystal orientation (texture) and other structural parameters, such as ...
求翻译:X-ray diffraction (XRD) patterns and transmission electron microscopy (TEM) micrograph were used to是什么意思?待解决 悬赏分:1 - 离问题结束还有 X-ray diffraction (XRD) patterns and transmission electron microscopy (TEM) micrograph were used to...
aX-ray diffraction (XRD) pattern were recorded with Brucker D8 Advanced X-ray diffraction measurement system, with Cu Kα source (λ=1.54A) X-射线衍射(XRD)样式记录了与Brucker D8先进的X-射线衍射测量系统,以Cu Kα来源(λ=1.54A)[translate]...
X-射线衍射XRD(Wide Angle X-rayDiffraction)主要是对照标准谱图分析纳米粒子的组成,分析粒径,结晶度等,一般要求纳米粒子的尺寸在几个纳米到100纳米以内。对谱图进行解析、归属谱线到晶面、推导出晶体的晶系晶型,还可以测得晶体掺杂情况、物相占比情况等等。根据XRD来计算晶粒大小的方法是用根据衍射峰的半高宽然后使用...
X-ray diffraction (XRD) patterns of the sediments formed in the solutions from the 40% hydrofluoric (HF) acid-immersed groups.Haifeng XieShuping ShenMengke QianFeimin ZhangChen ChenFranklin R. Tay