X-ray photoelectron spectroscopy (XPS) is, in principle, based on a particularly simple process. Electrons within a sample absorb photons of a particular energy and then emerge from the solid. The kinetic energy analysis of electrons emitted from the surface yields information on the electronic ...
1、Inst. Of PhotoelectronicsX射线射线光电子能谱(光电子能谱(XPS)X-ray Photoelectron SpectroscopyInst. Of Photoelectronics电子能谱学概论电子能谱学概论电子能谱学的定义电子能谱学的定义 电子能谱学可以定义为利用具有一定能量的粒子(光子,电子,粒子)轰击特定的样品,研究从样品中释放出来的电子或离子的能量分布...
X-Ray Photoelectron Spectroscopy Applications M.H. Engelhard, ... Y. Du, in Encyclopedia of Spectroscopy and Spectrometry (Third Edition), 2017 Abstract X-ray photoelectron spectroscopy (XPS) is, in principle, based on a particularly simple process. Electrons within a sample absorb photons of a...
X-ray photoelectron spectroscopy (XPS) is a popular analytical technique in materials science as it can assess the surface chemistry of a broad range of samples. This Primer concerns best practice in XPS analysis, aimed at both entry-level and advanced users, with a focus on thin film samples...
X射线光电子能谱_郭沁林
reviewtheprincipleofXPS,basicqualitativeandquantitativedataanalysismethods,andsomeapplicationexamples.Keywords X rayphotoelectronspectroscopy(XPS),electronspectroscopy,surfaceanalysis* 国家自然科学基金(批准号:10574153)资助项目2007-03-08收到 Emai:lqlguo@aphy.iphy.ac.cn1 引言自德国物理学家伦琴1895年发现X射线以来...
X-rayPhotoelectronSpectroscopy Inst.OfPhotoelectronics 电子能谱学的定义 •电子能谱学可以定义为利用具有一定能量的粒子(光子, 电子,粒子)轰击特定的样品,研究从样品中释放出来的 电子或离子的能量分布和空间分布,从而了解样品的基本 特征的方法。 •入射粒子与样品中的原子发生相互作用,经历各种能量转 递的物理效...
X-ray photoelectron spectroscopy (XPS) is widely used to identify chemical species at a surface through the observation of peak positions and peak shapes. It is less widely recognized that intensities in XPS spectra can also be used to obtain information on the chemical composition of the surface...
www.nature.com/scientificreports OPEN received: 12 October 2014 accepted: 09 March 2015 Published: 07 May 2015 Using "Tender" X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface Stephanus Axnanda1#, Ethan J. Crumlin1#, Baohua Mao1,...
Chapter3X-RayPhotoelectronSpectroscopy(XPS)andAugerElectronSpectroscopy(AES)RichardT.HaaschX-rayphotoelectronspectroscopy(XPS),alsoknownaselectronspectroscopyforchemicalanalysis(ESCA),andAugerelectronspectroscopy(AES)arewidelyusedmaterialscharacterizationtechniquesbelongingtothegeneralclassofmethodsreferredtoassurfaceanalysis....