x ray level x 射线能级 x ray line spectrum x 射线线光谱 x ray luminescence x 射线发光 x ray machine x 光机 x ray optics x 射线光学 x ray photoelectron spectroscopy x 射线光电子能谱学 x ray photoemission diffraction x 射线光电发射衍射 x ray refraction x 射线折射 x ray scattering x 射线...
x ray interferometer x 射线干涉仪x ray laser x 射线激光x ray level x 射线能级x ray line spectrum x 射线线光谱x ray luminescence x 射线发光x ray machine x 光机x ray optics x 射线光学x ray photoelectron spectroscopy x 射线光电子能谱学x ray photoemission diffraction x 射线光电发射衍射x ray ...
x-ray inspection x光检查x-ray intensity meter x射线强度计x-ray machine x光机x-ray metallography x射线金相学x-ray microanalysis x射线显微分析x-ray microradiography x射线显微放射照相法x-ray microscopy x-光显微术x-ray pattern x射线图案x-ray photoelectron spectroscopy x射线光电子能谱学x-ray ...
x-ray inspection x光检查 x-ray intensity meter x射线强度计 x-ray machine x光机 x-ray metallography x射线金相学 x-ray microanalysis x射线显微分析 x-ray microradiography x射线显微放射照相法 x-ray microscopy x-光显微术 x-ray pattern x射线图案 x-ray photoelectron spectroscopy x射线光电子能谱学...
X-ray inspection X光检查X-ray intensity meter X射线强度计X-ray machine X光机X-ray metallography X射线金相学X-ray microanalysis X射线显微分析X-ray microradiography X射线显微放射照相法X-ray microscopy X-光显微术X-ray pattern X射线图案X-ray photoelectron spectroscopy X射线光电子能谱学X-ray ...
X-ray metallography X射线金相学 X-ray microanalysis X射线显微分析 X-ray microradiography X射线显微放射照相法 X-ray microscopy X-光显微术 X-ray pattern X射线图案 X-ray photoelectron spectroscopy X射线光电子能谱学 X-ray photograph X射线照相 ...
The present invention relates to a hard X-ray photoelectron spectroscopy (haxpes) system equipped with an X-ray source that provides a beam of photons directed from a sample to be excited and directed to pass through the system.The X-ray tube 10 is connected to a monochromator vacuum chamber...
Die Stickstoff-1s-Peaks (siehe Diagramm) fallen nie zusammen, nicht einmal, wenn die NHN-Wasserstoffbr眉cken nahezu ideal symmetrisch sind wie im Fall von Dibenzo[cde,mno]porphycenen.doi:10.1002/1521-3757(20010119)113:2<445::AID-ANGE445>3.0.CO;2...
The growth conditions of InSe and γ-In2Se3 thin films have been investigated by X-ray diffraction, reflection high energy electron diffraction and X-ray photoelectron spectroscopy measurements. A phase diagram of InxSey thin films has been determined as a function of substrate temperature and ...
Electron Spectroscopy for Chemical Analysis (ESCA) X-Ray Photoelectron Spectroscopy (XPS) Louis Scudiero http://.wsu.edu/~scudiero; 5-2..