1 EE141VLSI测试与可测试性设计 1 课程导论 基本目的 1.使学生掌握VLSI系统测试和可测性设计的基本原理和主要方法；2.使学生把握VLSI系统测试和可测性设计的学科前沿方向；3.使学生对EDA系统中有关测试和可测性设计工具有初步认识和实践体会；4.使学生能够在与VLSI测试相关的学术研究和应用开发中直接发挥作用
Since the new hardware resources introduce quantization/rounding errors, then we reapplied to the whole DS and SS schemes the procedure for optimal data path/memory word lengths sizing addressed in Section 3.3. For the case of OWL=DWL=16 FFT/IFFT processing in TDD and FDD modem The duplex ...
RTL Netlist vs Synthesized Netlist The RTL code of design module is transformed into gate level netlist through the process of synthesis.Synthesis is the most curricular step in chip designing among all other steps. At the synthesis process one can visualize the designs which will appear after man...
The integral flux vs LET curves, shown in Fig. 3, determines the range of LET and flux of particles in sun-synchronous LEO environment, transmitted through Al shields with 100 mils thickness, to be encountered by a SRAM cell of on-board sun-synchronous satellite [12]. The fluence distributi...
Electronic technologies such as digital computers, calculators, audio devices, video equipment and telephone systems have facilitated increased productivity and reduced costs in a number of activities, including the analysis and communication of data, ideas and trends in most areas of business, science,...
FIG. 7 is a curve diagram showing the pull-up and the pull-down delay times vs. supply voltage of the 1.5 V full-swing bootstrapped CMOS driver circuit of the present invention in driving an output load of 10 pF. As shown in the figure, for a large supply voltage, the difference in...
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2 Academy of Scientific & Innovative Research (AcSIR), Pilani 333031, Rajasthan, India 3 Electronic Science Department, Kurukshetra University, Kurukshetra 136119, Haryana, India; vohra64@gmail.com * Correspondence: sanjay.csirceeri@gmail.com; Tel.: +91-1596-252-214; Fax: +91-1596-242-294 ...