Applying machine learning to analyze data from design and test flows has received growing interests in recent years. In some applications, data can be limited and the core of analytics becomes a feature search
Testing of data paths in VLSI arraysfault-free boundariesVLSI arraysregistersdata paths testingswitchesdata linksswitch failuresAn important issue in VLSI array design is how to test switches and data links in an array. The authors present a 'divide-and-conquer' technique for testing data paths ...
A circuit means for detecting data errors in VLSI processing circuits at the earliest point such an error occurs in the processing stream or (in different modes) at any selected point therein, and for
A new model for highly parallel and distributed processing in huge amounts of complexly structured data has been presented. The model, called Logic Flow in Active Data,consists of the two integral parts: Active Knowledge Network keeping distributed...
This paper is devoted to a novel stochastic generalized cellular automata (GCA) for self-organizing data clustering in enterprise computing. The GCA transforms the data clustering process into a stochastic process over the configuration space on a GCA array. The GCA-based approach to data clustering...
At this level of abstraction, theVLSIdesigner has a lot of freedom in employing many techniques to reduce thepower dissipation. Normally, decisions at this level have a global effect on the whole system. For example, inactive hardware modules may be automatically turned off to save power; module...
The cellular network is now nearly an almost ubiquitous and real-time sensor with coverage anywhere and anytime for any device. Mobile network data is a ri
Points (Cities in large-scale map) Extent (rivers, forest, etc.) Vector (approximation by geometric objects) Raster (A set of pixels in the grid) Application Spatial data GIS Segemented images Components of CAD constructs or VLSI circuit ...
test.data.table gets new argument silent, if set to TRUE then it will not raise exception but returns TRUE/FALSE based on the test results. dim.data.table is now implemented in C. Thanks to Andrey Riabushenko. Better fix to fread's check.names argument using make.names(), #1027. Than...
In Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Amsterdam, The Netherlands, 1–3 October 2014; pp. 258–263. [Google Scholar] Arifeen, T.; Hassan, A.; Lee, J.A. A Fault Tolerant Voter for Approximate Triple ...