The present invention provides a vertical-type probe card, comprising: a multilayer module having a plurality of follower deformability, an insulating plate and a plurality of guide probes. 多个从动件固定并电性连接于多层模块的一空间转换层,绝缘导引板则开设多个导孔,致使每一与从动件分离的探针可滑移...
PROBLEM TO BE SOLVED: To provide a vertical-type probe card, capable of accurately positioning electrode pads to deep needle pins, and to provide a substrate test method capable of correctly contacting each deep needle pin and each electrode pad by transferring a placement base in Z-axis directi...
网络垂直式探针卡;垂直探针卡;垂直式晶圆探针卡 网络释义
High parallelism, vertical probe card for automotive and industrial devices Product Overview Key Features Downloads Connect to an Expert Looking for customer support? Ready to learn more about our products and services? Contact Sales Today Stay Connected ...
探针卡Probe Card 探针卡是公司的主要产品,可以适用于半导体CP测试,FPD测试 Nand Flash 300mm 用 MEMS探针卡 此薄膜探针可用于DRAM测试,Nand Flash 300mm 测试 移动DRAM用 MEMS探针卡 此薄膜探针可用于DRAM测试,Nand Flash测试 DDI/LDI 探针卡 本探针卡适用于LCD Drive IC,以及Display Drive IC test ...
PURPOSE: A vertical probe card is provided to manufacture vertical probes having appropriate elastic transformations and mechanical intensity, to attach the probes on a substrate with high density, to eliminate leakage current between the probes, to restore the probes to original shapes after measuring...
晶片probecardwafersiliconvertical 晶圓級探針卡簡介■台北科技大學機電整合研究所黃榮堂賴文雄本文介紹一種以微機電技術(MEMS)為基礎製作「可含有力回饋高精度垂直式探針卡」與「高頻GSG探針」的方法,應用的範圍著重於晶圓裸晶(dieorchip)的測試,以減少baddie完成封裝後所造成損失。其特徵為使用多層式厚光阻並使用電...
A probe card is electrically connected to a tester, electrically contacted and connected to circuits to be tested, and used to transmit test signals between the tester and the circuits. It includes a plate assembly having a printed board and an earth plate insulated from each other. Probe assem...
The vertical-type probe card of this paper used Si-wafer as substrate. The key point is to use buffer layers of low k elastomer, such as hydrogen silesquio... JM Lin,WJ Tsai - 《Tamkang Journal of Science & Engineering》 被引量: 0发表: 2007年 Fabrication and Characterization of Silicon...
Provided is a vertical probe card, the vertical probe card includes: a printed circuit board (PCB) including a bottom hole and a PCB pad surrounding the bottom hole; a cover plate disposed on the PCB and including a cover hole, where the cover hole and the bottom hole are disposed coaxial...