探针卡(probe card)是晶圆测试(wafer test)中被测芯片(chip)和测试机之间的接口,主要用于芯片封装前对芯片的电学性能进行初步测试,并筛选出不良芯片后,再进行之后的封装工程,因此,探针卡的作用至关重要,属于半导体核心检测耗材。 下面我们就来介绍一下在半导体晶圆测试中的探针卡,以及探针卡的类型之一——垂直式探针...
An end portion of a probe tail of the probe is located between the groove bottom surface and the upper surface. A probe card is also provided and the probe card includes a circuit board, a space transformer, and the probe head.Che-Wei LinTing-Ju WuKeng-Min SuChin-Yi Lin...
Probe Head Key Features Temperature Features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55 ̊C to +155 ̊C. Packages BGA, FBGA, LGA, Pad, QFN, and WLCSP. Singulated packages, strip test and wafer-level chip scale test. Optimized Dielectic ...
PROBE CARD Theprobe card is provided with a plurality of probes composed of a conductive materialfor inputting or outputting an electric signal by being brought into contactwith electrode pads of a semiconductor wafer; a probe head for storing and... YAMADA, Yoshio,山田 佳男,NAKAYAMA, Hiroshi,...
High performance probe cards for the semiconductor industry. Our proven technology delivers unparalleled performance and enables tight contact pitch across temperatures.
The REVO probe can also do "head touch" probing or be used for traditional machine-touch probing when the situation calls for touches. renishaw.com 需要接触式测量时,REVO测头也可以进 行“测座碰触式”测量或者用于传统机器碰触式测量。 renishaw.com.cn The unique ‘inferred calibration’ technique...
[3] 1168/9B-Series Differential and Single-Ended Probes; 本文在知乎和CSDN同名账户同步发布,如需阅读更多技术文章,请关注本人的CSDN博客,可通过以下同文链接进入: 如何正确使用高速探头前端--probe head-CSDN博客blog.csdn.net/2301_77080582/article/details/135476077...
Proposed are a probe head and a probe card having the same. The probe head according to the present disclosure includes a plurality of guide plates each having a guide hole, wherein each of the guide plates has a shape in which a plurality of layers are stacked, and each of the guide ...
The present disclosure relates to a probe head receiver, which includes: a first template, a guide plate and a spacer. The first template has a number of apertures of a first size. The guide plate has a number of apertures of a second size, each of the number of apertures of the first...
摘要：A probe card having improved accuracy of parallelism and accuracy of planarity of a probe head to a prescribed reference surface. The probe head stores a probe for electrically connecting circuit structures. The probe card is provided with a probe head (15) for holding a plurality of ...