Buffer mechanismFor the recent CMOS feature sizes power dissipation becomes an overriding concerns for VLSI circuit design. We propose a novel approach named tri-state buffer with common data bus which reduces
Here, the enable signal may be active high (top, 1 to enable the buffer) or active low (bottom, 0 to enable the buffer). Sign in to download full-size image Figure 6.59. Tristate buffer symbol The tristate buffer can be created in VHDL using the If-then-else statement, as shown ...
VLSIcircuitdesign.Weproposeanovelapproach namedtri-stateelasticbufferdesignwhichreduces thetotalpower,area&delayofelasticbuffer.The paperpresentsadesignandimplementationoftri- statebuffermechanismin120nmtechnology. Thisdesignoffersalsotheadvantageofthirdstate ...
It is possible to improve delay even further by merging the AND/OR functions of a tristate buffer. FIG. 7is a flowchart of processing performed in implementing a tristate bus on an FPGA in accordance with an example embodiment of the invention. In general, the process uses the number of ...
3. The memory device of claim 1 wherein the plurality of memory cells are configured as a feedback loop to maintain the charge stored at each memory cell. 4. The memory device of claim 1, wherein each of the array of memory cells comprises two cross coupled tri-state inverters. ...
The epitaxially grown SiGe source/drain stressor (e-SiGe) technique has emerged to be a consistent performance booster for advanced devices below the 14 nm technology node. At nanoscale, the omnipresent residual stress is now becoming an important source of variability in advanced VLSI technologies ...
This paper presents a high speed BiCMOS tristate buffer with a single bipolar device pull-up structure for driving a bus with a large capacitive load. With the new pull-structure, the BiCMOS tristate buffer, which is suitable for microprocessor VLSI, has an improvement in delay time of 30%...
VLSI Test Symposium, 1996., Proceedings of 14thConsistently Dominant Fault Model for Tristate Buffer Nets - Powell - 1996 () Citation Context ...ared for ITC’05) Page 4 of 9Scan cell 2.3 Testing Normal Scan−in D Q The tests target all the stuck-faults in the CUT. Consistently ...
4. The interconnect driver circuit of claim 1 wherein the tri-state circuitry comprises: an input to receive an enable signal, the input coupled to a control connection of the tri-state transistor for disabling the tri-state transistor in response to the enable signal; and ...