Cerezo, "Oxidation and the structure of the silicon/oxide interface," Phil. Mag. B 55, 201 (1987).A. M. Stoneham, C. R. M. Grovenor, and A. Cerezo, "Oxidation and the Structure of the Silicon/Oxide Interface," Phil. Mag. B 55, 201 (1987)....
The critical angle of total reflection was determined and the reflection as function of the energy was measured below the critical angle. EXAFS analysis of the data reveals the oxygen content in the samples, and the local structure around the silicon absorbers. The measurements show the strength ...
ANewStructureofSilicon-on-InsulatorMeta1.Oxide.SemiconductorFieldElect TransistortoSuppresstheFloatingBodyEfect ZHUMing(朱鸣),LINQing(林青),ZHANGZheng-Xuan(张正选),LINCheng-Lu(林成鲁) StateKeyLaboratoryofEhnctionalMaterialsforInformatics,ShanghaiInstituteofMicrosystemandInformation Technology,ChineseAcademyofScienc...
silicon dioxide- a white or colorless vitreous insoluble solid (SiO2); various forms occur widely in the earth's crust as quartz or cristobalite or tridymite or lechatelierite silica,silicon oxide cristobalite- a white mineral consisting of silica; found in volcanic rocks ...
(i) reduces defect generation at the Si–SiO 2 interface, (ii) allows use of physically thicker dielectrics when incorporated into oxide–nitride stacked gate dielectrics, and (iii) prevents boron atom transport out of heavily doped p + polycrystalline silicon gate electrodes when nitrided layers ...
on bare Al(100), for both Si coverages studied.Our findings indicate that, in addition to a vanishing oxygen adsorption energy and Mott potential, a detailed picture of atom exchange and transport at the metal/oxide interface has to be taken into account to explain the limiting oxide ...
reliefContamination on the surface of a silicon relief structure during plasma cleaning has been detected. The kinetics of the growth of an oxide film and the change in the dimensions of the components of tdoi:10.1007/s11018-015-0820-1Gavrilenko, V. P...
The interface between diamond and silicon, fabricated by growing diamond films on (001) silicon by microwave plasma assisted chemical vapor deposition (MPACVD), was characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy loss spectroscopy (EELS). Two types of inter...
In this work, we visualize the structure and chemistry of the SEI on silicon anodes using atomic-resolution cryogenic (scanning) transmission electron microscopy (cryo-(S)TEM) and electron energy loss spectroscopy (EELS), revealing its evolution over the first cycle. We discover the origin of ...
This study presents the mechanical and water absorption properties of self-compacting mortars containing various amounts of nanoparticles, including nano-silicon dioxide (NS), nano-iron(III) oxide (NF) and nano-copper oxide (NC) used in binary and ternary combinations. The nanoparticles were added...