A spotlight on researcher's work using JEOL electron microscopy or JEOL analytical instruments, and how their scientific advances are impacting their field. AMUGcoming in 1 days Sun Mar 30, 2025 - Thu Apr 03, 2025 Chicago, IL AZ Imaging & Microanalysis Society (AIMS)coming in 3 days Tue Ap...
Electron diffraction (ED) examination was made at an accelerating voltage of 箔为传输电子显微镜术(TEM,式样JEOL 3013,有限公司,东京,日本JOEL)使用常规技术准备了: 样品被采取了对用机器制造的光学稀薄的箔,并且离子束变薄了对电子透明度。 电子衍射(ED)考试被做了在200千伏加速的电压在MgOCr2O3砖的仔 [...
2.2 特证描述 笔者应用粉末X射线衍射(XRD)方法,使用带有Cu Kα辐射(15kV、30mA)的衍射仪(MiniFlex, Rigaku)对CeO2NPs的制备进行特征描述;通过在200kV的加速电压下工作的JEM-2010(JEOL)确认其形态;使用环境透射电子显微镜(ETEM, JEM-1000K RS; JEOL)对CeO2NPs碳污染的形成和去除进行原位观察。该仪器具有高达ca....
A cryo-transfer specimen- holder (EM-CTH 11, JEOL Ltd.) was used to cool and crystallize the specimen in the TEM column. The speci- men temperature was controlled to be -25°C for NR, at which the growing rate of the a-filaments in an NR thin film was reported to be approximately...
In-situ TEM compression was conducted on the annealed pillars using a TEM nanoindentation holder (TEM-indenter, Nanofactory, Gothenberg, Sweden) equipped with a flat diamond punch in the field emission TEM (JEM-2100 F, JEOL, Tokyo, Japan). The compressive deformation was carried out in disp...
The bright-field TEM images of the sample structure, selected area diffraction patterns (SADPs), and convergent beam electron diffraction (CBED) patterns were recorded on a Jeol JEM 2100 transmission electron microscope (Jeol, Japan) operating at 200 kV. ...
JEOL Ltd. 3-1-2 Musashino, Akishima, JP-196-8558 Tokyo, JapanH. RyllPNSensor GmbH Otto-Hahn Ring 6, DE-81739 Munchen, GermanyPNDetector GmbH Otto-Hahn Ring 6, DE-81739 Muenchen, Germany;PNDetector GmbH Otto-Hahn Ring 6, DE-81739 Muenchen, Germany;PNDetector GmbH Otto-Hahn Ring 6, DE...
For example, autoloader stages such as those used in Titan Krios (Thermo Fisher Scientific) and CRYOARM (JEOL) microscopes demonstrate that multiple sample grids can be stored stably for a long period of time, the sample grid can be automatically transported, and data can be automatically ...
Foils for TEM studies were prepared using an ion etching setup EM 09100IS (JEOL, Japan) in the cross-section geometry. Cross-sectional TEM/EDS analysis was performed utilizing on the 200kV JEM-2100 TEM coupled with an INCA energy dispersive spectrometer combined with the X-Max Silicon Drift ...
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