型号 JEM-2100Plus 加工定制 否 是否进口 是 点分辨率 0.194nm 线分辨率 0.14nm 加速电压 200KV MAG模式 x 2,000 – 1,500,000 Low MAG模式 x 30 – 6,000 SA MAG模式 x 8,000 – 800,000 倍率(STEM) x 2,000 – 2,000,000 高分辨HR 0.23nm 高倾斜HT 0.25nm 冷冻传输CR 0.27...
日本电子 JEOL 透射电镜 TEM JEM-2100Plus 六硼化镧 进口 ￥250.00万 查看详情 德国蔡司ZEISS 扫描电镜 SEM 六硼化镧灯丝高分辨率 EVO10 进口 ￥100.00万 查看详情 德国 布鲁克红外光谱仪 INVENIO 傅立叶变换FTIR 研究级 进口 ￥28.00万 本店由中国供应商运营支持 获取底价 商品描述 价格说明 联系我们 型...
The bright-field TEM images of the sample structure, selected area diffraction patterns (SADPs), and convergent beam electron diffraction (CBED) patterns were recorded on a Jeol JEM 2100 transmission electron microscope (Jeol, Japan) operating at 200 kV. ...
For apoferritin, the frozen grid was mounted on a Gatan 626 cryo-transfer specimen holder at liquid nitrogen temperature and loaded into either a JEM2100F microscope (JEOL) equipped with a K2 Summit direct electron detector (DED) (Gatan Inc) (Setting A) or a JEM2200FS microscope (JEOL) ...
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JEOL品牌JEM-F200型自动进样场发射透射电镜 高分辨率成像仪器 在线交易 距您较近 自动 深圳市科时达电子科技有限公司 3年 查看详情 ￥850.00/套 安徽合肥 DELF透射电镜全套(包埋+制片+拍照)一站式技术服务 可先货后款 全套 合肥万物生物科技有限公司 1年 查看详情 ￥80.00/个 上海 tem图像分析 透射电镜 SEM...
In-situ TEM compression was conducted on the annealed pillars using a TEM nanoindentation holder (TEM-indenter, Nanofactory, Gothenberg, Sweden) equipped with a flat diamond punch in the field emission TEM (JEM-2100 F, JEOL, Tokyo, Japan). The compressive deformation was carried out in disp...
Foils for TEM studies were prepared using an ion etching setup EM 09100IS (JEOL, Japan) in the cross-section geometry. Cross-sectional TEM/EDS analysis was performed utilizing on the 200kV JEM-2100 TEM coupled with an INCA energy dispersive spectrometer combined with the X-Max Silicon Drift ...
求翻译:a JEOL JEM 2100F FETEM是什么意思?待解决 悬赏分:1 - 离问题结束还有 a JEOL JEM 2100F FETEM问题补充:匿名 2013-05-23 12:21:38 一个日本电子JEM 2100F FETEM 匿名 2013-05-23 12:23:18 JEOL JEM 2100F FETEM 匿名 2013-05-23 12:24:58 JEOL JEM 2100F FETEM 匿名 2013...
Microstructural studies were carried out by scanning and transmission electron microscopy using Tescan Mira (SEM, Tescan, Brno, Czech Republic) and Jeol JEM-2100 (TEM, JEOL, Tokyo, Japan) electron microscopes equipped with an Energy-Dispersive Spectroscopy (EDS) unit. To study the structure by TEM...