Connect electrical probes to the sample for in situ measurements Sample can be height adjusted from 0–25 mm manually Measurements of probe currents View product Download datasheet Eucentric Sample Holder Eucentric tilting and compucentric rotation on a desktop SEM Fast time-to-image with sample lo...
Preferred solution for metallurgy and when working with inserts Sample size up to 32 mm diameter and 30 mm height Download datasheet Micro Tool Sample Holder Quick and fast clamping Tilting and rotation allow for easy sample positioning No extra tooling required for sample loading ...
电子显微镜 透射电子显微镜(TEM) TEM全称为Transmission Electron Microscopy,即透射电子显微镜。针对所有材料科学应用提供快速、精确和定量表征的TEM透射电子显微镜成像。联系我们技术 SEM扫描电镜 台式扫描电镜 TEM透射电镜 冷冻电镜 (Cryo-EM) FIB-SEM DualBeam EFA 系统 电路编辑 XPS仪器 样品制备 EM软件 电镜附件 行业...
Preferred solution for metallurgy and when working with inserts Sample size up to 32 mm diameter and 30 mm height Download datasheet Micro Tool Sample Holder Quick and fast clamping Tilting and rotation allow for easy sample positioning No extra tooling required for sample loading ...
Metallurgical Sample Holder Designed to support resin-mounted samples Preferred solution for metallurgy and when working with inserts Sample size up to 32 mm diameter and 30 mm height View product Download datasheet Micro Tool Sample Holder Quick and fast clamping Tilting and rotation allow for easy...
Metallurgical Sample Holder Designed to support resin-mounted samples Preferred solution for metallurgy and when working with inserts Sample size up to 32 mm diameter and 30 mm height View product Download datasheet Micro Tool Sample Holder Quick and fast clamping Tilting and rotation allow for easy...