stuck-at-faulttestingquasi-delay-insensitive logic circuitslogic simulationIn Quasi-Delay-Insensitive (QDI) circuits, some single stuck-at-faults may cause run-away transitions without stopping normal transitions. This paper clarifies problems in detecting such stuck-at-faults and proposes a method for...
We propose testing large scale asynchronous logic circuits using module partitioning and regarding the circuits as module networks. We first aenerate test sequences for each module,and then apply them to the network.The testable sequences in the network require the properties of controlling,propagation...
As a result, any complete test set for single stuck-at faults proves to still remain valid in the presence of undetectable bridging faults.关键词: Theoretical or Mathematical/ logic testing/ undetectable bridging faults feedback loops unate two-level irredundant AND-OR network stuck-at fault ...
工作在正常模式下,这时候开始检查function上的pin连接。 低速DC capture也就是我们经常说的Stuck-at模式,主要检查我们平时常见的stuck-at0/1错误。比如下图中的inverterA端如果被接到了VSS端的话,就是一个stuckat1的fault。 (b).AC capture AC capture也被称为At-speed Structural Test ...
Survey for Stuck At Fault Modelling of Digital Circuits At Register Transfer Logic (RTL) Thus there is a need to look for a new approach of testing the circuits at higher levels to speed up the design cycle. Different methods are implemented to detect the faults such as stuck-at faults in...
Partial differences can also be used to find sets of tests for internal and multiple stuck-at faults. Multivalued derivatives described by several other authors and Boolean differences are special cases of partial differences. 展开 关键词: Boolean functions fault location logic testing many-valued ...
ATPG and DFT Algorithms for Delay Fault Testing In the dissertation, two algorithms are first proposed for computing and applying transition test patterns using stuck-at test vectors, thus avoiding the need for a transition fault test generator. The experimental results show that we ... XLX Liu...
1) stuck-at fault 固定故障1. So a fault diagnosis and location software is proposed,which can diagnose and locate the stuck-at faults and bridging faults in digital circuits effectively. 针对目前数字电路开发和生产过程中对电路的故障诊断效率低下的问题,开发了故障诊断定位软件,能有效地对数字电路中...
Fault Models //故障模型 故障模型是制造缺陷导致的故障现象的抽象描述,用于生成测试向量去检测这些缺陷。缺陷及故障模型包括: Functional Defects : Stuck-at Fault Model //功能性缺陷: Stuck-at 故障模型 Current defects : Pseudo Stuck-at Fault Model (IDDQ) //电流缺陷:Pseudo Stuck-at 故障模型(IDDQ) Spee...
logic testing/ cell methoddetecting multiple faultscombinational networksnear optimal test generationmultiple stuck at fault test generationtest set generationlogic testing/ B1265B Logic circuits C4230B Combinatorial switching theory C5210 Logic design methods...