Thin films and layered structures have become significant in many areas of technology, especially in the manufacture of electronic, magnetic, and optical devices. The ability to achieve certain desired properties in thin films is vital to the success or the failure of a particular product. The ...
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Structure and properties of multilayered thin films, von Tai D. Nguyen, Bruce M. Lairson, Bruce M. Clemens, Sung鈥怌hen Shin, Katsuaki Sato, Symposium Proceedings, Volume 382, Materials Research Society, Pittsburgh, Pennsylvania 1995, $ 74.00 (MRS Members), $ 85.00 (U.S. List), $ 98.00...
- 《Journal of Vacuum Science & Technology A Vacuum Surfaces & Films》 被引量: 30发表: 1991年 Fabrication and physical properties of radio frequency sputtered Cd1-xMnxS thin films Highly oriented Cd1-xMnxS thin films with a wurtzite structure were grown by the radio-frequency sputtering ...
structure and properties of AlN thin films.This paper mainly researched on the effects of bias on the structure and properties of AlN thin films.The results show that the AlN thin films are made up of AlN and Al phases.With the increasing bias,the crystallinity of the AlN thin films is ...
The structure and properties of phthalocyanine films grown by the molecular beam epitaxy technique. I. Preparation and characterization Ultrathin films of the cofacially stacked F‐bridged Al‐phthalocyanine polymer, (AlPcF)n, have been grown using the highly controlled technique of molecul... AJ ...
It is known that mechanical, physical-chemical and electrical properties of amorphous and nanocrystalline thin-film materials can be differ significantly from the properties of materials in usual crystalline state. In thin-film layers, the heterogeneous reactions also can be proceeds quite differently tha...
-E. Morosanu.The preparation, characterization and applications of silicon nitride thin films.Thin Solid films. 1980... CE Morosanu - 《Thin Solid Films》 被引量: 229发表: 1980年 CVD glass films for passivation of silicon devices - Preparation, composition, and stress properties Results of ...
Vacuum‐deposited thin films have a columnar structure that includes appreciable void volume. This structure is responsible for many differences between the properties of materials in the form of thin films and in bulk. Refractive index is usually reduced and is a sensitive function of preparation co...
This thesis presents the structure and physical properties of silicon rich oxide (SRO) films and SiOx nanowires for their potential applications in non-volatile memory device or opticaland bio-sensors. As an extension of earlier study, the mechanical properties of SRO films deposited by plasma enhan...