Optical Properties of Solid Thin Films by Spectroscopic Reflectometry and Spectroscopic Ellipsometry; City University of New York: New York, NY, USA, 2008.Miller, D.A. and C.U.o.N.Y. Chemistry, Optical Properties of Solid Thin Films by Spectroscopic Reflectometry and Spectroscopic Ellipsometry. ...
The Optical Properties of Thin Solid Films 作者:Heavens, O.S. 出版社:Dover Pubns 出版年:2011-2 页数:288 定价:$ 16.89 装帧:Pap ISBN:9780486669243 豆瓣评分 评价人数不足 写笔记 写书评 加入购书单 分享到
Optical Properties of Solid Thin FilmsNo Abstract available for this article.doi:10.1038/1661016b0NoneNature Publishing Group UKNature
This was quantified by considering the absorption edge of Al–rich TixAl1 − xN films and applying the appropriate modeling [29], [30]. On the other hand, other aspects of the optical properties of TixAl1 − xN films, such as the spectral position of the interband transitions and ...
In the present study, the authors report a new side of DNA’s physical properties, unique nonlinear optical behavior of DNA thin solid film in the femtosecond regime, and the application of DNA as a biocompatible SA to realize an ultrafast Er-doped fiber laser, for the first time to the ...
The preparation of ZnO thin films with controlled electrical resistivity and optical properties is often challenged by the presence of defects, such as oxygen vacancies or interstitial zinc. Here, we investigate the material properties of ZnO polycrystalline thin films prepared by thermal Atomic Layer ...
- 《Thin Solid Films》 被引量: 118发表: 2002年 The effect of substrate temperature on the optical properties of polycrystalline Sb2O3 thin films Polycrystalline antimony trioxide (Sb2O3) thin films with a thickness of 800 nm, deposited on glass substrates at different temperature ranges 300–...
Thin films of cerium dioxide (CeO 2) were prepared on glass substrates by the spray pyrolysis process using an aqueous solution of CeCl 3,7H 2O or Ce(NO 3) 3. The structure, surface morphology chemical composition and optical properties of these films were investigated. X-Ray diffraction and...
The effects of structural, microstructural, optical, surface and cross-sectional morphological properties of Cr thin films were investigated on the emittance. An optimal thickness about 450 nm of the Cr thin film for the lowest total thermal emittance of 0.05 was obtained. The experimental results ...
Silver thin films were prepared by an rf-magnetron sputtering technique. Real-time spectroscopic ellipsometry was employed to investigate the initial growth behavior of the silver films, and the optical properties of the films were determined by a three-parameter ellipsometric technique. In the initial...