Technical CVD-grown silicon carbide (尾-SiC) layers on graphite substrates have been studied by infrared spectroscopy. Specular reflectance spectra were measured at oblique incidence, and for the same experimental conditions such spectra were simulated starting from oscillator parameters which basically ...
and effective pressure on the air pocket caused the exponential decay of τ d by increment of In case of SLIPS, the total reflection phenomena do not occur due to the absence of the air pockets. Therefore, the relative intensity method does not work for the underwater stability measurement...
Presents information on a study that examined the infrared reflection spectra of sintered silicon-carbide (SiC) thermoelectric semiconductors using scanning electron microscope, electron probe microanalysis and x-ray diffraction. Samples and measurements; Infrared reflection spectra of SiC; Conclusions.Okamoto...
Kamata, K. Izumi, Infrared attenuated total reflection spectroscopy of 6H-SiC(0001) and (000(1)over-bar) surfaces. J. Appl. Phys. 85, 3569-75 (1999)Tsuchida H,Kamata I,Izumi K.Infrared attenuated total reflection spectroscopy of 6HSiC(0001)and(0001) surfaces. Journal of Applied Physics ...
Infrared reflection investigation of ion-implanted and post-implantation-annealed epitaxially grown 6H-SiC. W. Chang,Z. C. Feng,J. Lin, et,al. Surface and Interface Analysis . 2002W. Chang,Z. C. Feng,J. Lin, et,al.Infrared reflection investigation of ion-implanted and post-implantation-...
Infrared attenuated total reflection spectroscopy of 6H – SiC „ 0001 … ¯ … surfaces and „ 0001Tsuchida, HKamata, IIzumi, K
and Karoui, R. 2008. Mid infrared attenuated total reflection spectroscopy as a rapid tool to assess the quality of Sicilo-Sarde ewe's milk during the lactation period after replacing soybean meal with scotch bean in the feed ration. Food Chemistry 106 361-368....
infrared spectrapulsed laser depositionreflection high energy electron diffractionsemiconductor growthsemiconductor thin filmssilicon compoundssurface topographywide band gap semiconductorsPulsed laser deposition (PLD) is well known as a reliable, economical technique for the growth of high-temperature ...
In addition, the complex relationship between particle size distribution and radiation characteristics was tested and studied with the help of XRD, SEM, attenuated total reflectance infrared spectroscopy (ATR-FTIR), etc. The work in this paper is just the beginning and a foundation, the purpose of...