Digital circuits are classified into two major categories namely, combinational circuits and sequential circuits. We have already discussed about combinational circuits in the earlier chapters of this tutorial. This chapter will highlight the details of sequential circuits....
static combinational circuitsclocked CMOS circuitsdifferential cascaded voltage switch circuits (DCVS)Summary This chapter contains sections titled: Static Combinational Circuits Clocked Combinational Circuits High Speed Circuits Logic Arrays Sequential Circuits Problems References Further Reading...
SequentialCircuitsSequentialCircuits LatchesandFlipLatchesandFlip--FlopsFlops Inpreviouslectures,weconsidercombinationalcircuitswhereInpreviouslectures,weconsidercombinationalcircuitswhere thevalueofeachoutputdependssolelyonthevaluesofthethevalueofeachoutputdependssolelyonthevaluesofthe ...
G. Saab, "Dynamic fault diagnosis of combinational and sequential circuits on reconfigurable hardware," Journal of Electronic Testing: Theory and Ap- plications, vol. 23, no. 5, pp. 405-420, 2007.F. Kocan and D. Saab, "Dynamic Fault Diagnosis of Combinational and Sequential Circuits on ...
combinational circuits. In this paper, we will show that the method extends to sequential circuits; we will also show that the table can be accurately represented by a simple analytical equation, and we will describe the required automatic characterization flow. The 4D macromodel considers ...
Several different types of circuits are used to build registers, each with its own advantages and disadvantages. We can define two different axes along which to categorize registers: • How they store their value. • How they react to the clock signal. Static and dynamic registers Registers ...
Single Event Double Node Upset Tolerance in MOS/Spintronic Sequential and Combinational Logic CircuitsSingle Event Double Node Upset Tolerance in MOS/Spintronic Sequential and Combinational Logic CircuitsSTT-MRAMMagnetic tunnel junction (MTJ)NonvolatilityRadiation...
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Self-Dual Complement Method up to Constant-Weight Codes for Arrangement of Combinational Logical Circuits Concurrent Error-Detection Systems Authors of this article are being recommended a new approach to concurrent checking method arrangement, composed of main features of Self-Dual Complement Method togeth...
6321184 Reduction of arbitrary L1-L2 circuits for enhanced verification 2001-11-20 Baumgartner et al. 6308299 Method and system for combinational verification having tight integration of verification techniques 2001-10-23 Burch et al. 6301687 Method for verification of combinational circuits using a filt...