combinational circuits. In this paper, we will show that the method extends to sequential circuits; we will also show that the table can be accurately represented by a simple analytical equation, and we will describe the required automatic characterization flow. The 4D macromodel considers ...
Summary This chapter contains sections titled: Static Combinational Circuits Clocked Combinational Circuits High Speed Circuits Logic Arrays Sequential Circuits Problems References Further Readingdoi:10.1002/0470020717.ch6Kurt HoffmannUniversity of the Bundeswehr Munich, GermanyJohn Wiley & Sons, Ltd...
Get PDF (1178K) Keywords: sequential circuits; test generation; acyclic structure; internally balanced structure; partial scan Abstract If, upon substituting signal lines for all flip-flops in a sequential circuit, the test generation problem for this sequential circuit can be reduced to the problem...
Single Event Double Node Upset Tolerance in MOS/Spintronic Sequential and Combinational Logic Circuitsdoi:10.1016/j.microrel.2016.12.003STT-MRAMMagnetic tunnel junction (MTJ)NonvolatilityRadiation immunitySoft errorSingle event upset (SEU)Single event double node upset (SEDU)...
In this chapter we illustrate some applications of Boolean reasoning in the design of multiple-output switching circuits. The stimulus applied to the circuit shown in Figure 9.1 is an input-vector, X = (x1, x2,..., x m ) , of bi
4Chapter Combinational Logic Design The foundations for the design of digital logic circuits were established in the preceding chapters. The elements of Boolean algebra (two-element "switching algebra") and how the operations in Boolean algebra can be represented schematically by means of gates (...
Low power test is taking center stage for both combinational and sequential circuits in recent years due to its impact on overall yield. This paper proposes a technique that targets the reduction of peak current during combinational circuit test to realize peak power reduction. Unlike previous ...
Unified Design of Self-Checking and Fail-Safe Combinational Circuits and Sequential Machines 来自 IEEEXplore 喜欢 0 阅读量: 38 作者:M Diaz,P Azéma,JM Ayache 摘要: This correspondence deals with a unification and extension of some previous work on self-checking (SC) and fail-safe (FS) ...
System and software for verifying that a model of an integrated circuit satisfies its specification includes performing a sequence of at least one sequential transformation on a seq
System and software for verifying that a model of an integrated circuit satisfies its specification includes performing a sequence of at least one sequential transformation on a seq