combinational circuits. In this paper, we will show that the method extends to sequential circuits; we will also show that the table can be accurately represented by a simple analytical equation, and we will describe the required automatic characterization flow. The 4D macromodel considers ...
Summary This chapter contains sections titled: Static Combinational Circuits Clocked Combinational Circuits High Speed Circuits Logic Arrays Sequential Circuits Problems References Further Readingdoi:10.1002/0470020717.ch6Kurt HoffmannUniversity of the Bundeswehr Munich, GermanyJohn Wiley & Sons, Ltd...
and Computer Science Case Western Reserve University Cleveland OH USASpringer USJournal of Electronic TestingF. Kocan and D. G. Saab, "Dynamic fault diagnosis of combinational and sequential circuits on reconfigurable hardware," Journal of Electronic Testing: Theory and Ap- plications, vol. 23, no...
Unified Design of Self-Checking and Fail-Safe Combinational Circuits and Sequential Machines 来自 IEEEXplore 喜欢 0 阅读量: 18 作者:Diaz,M.,Azema,P.,Ayache,M J.摘要: This correspondence deals with a unification and extension of some previous work on self-checking (SC) and fail-safe (FS) ...
Get PDF (1178K) Keywords: sequential circuits; test generation; acyclic structure; internally balanced structure; partial scan Abstract If, upon substituting signal lines for all flip-flops in a sequential circuit, the test generation problem for this sequential circuit can be reduced to the problem...
In this chapter we illustrate some applications of Boolean reasoning in the design of multiple-output switching circuits. The stimulus applied to the circuit shown in Figure 9.1 is an input-vector, X = (x1, x2,..., x m ) , of bi
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Thomas R. Shilpe, Vigyan Singhal, Robert K. Brayton, and Alberto L. Sangiovanni-Vincentelli. Analysis of combinational cycles in sequential circuits. In Proceedings of the International Symposium on Circuits an Systems (ISCAS), vol. IV, pp. 592-595, May 1996. ...
Single Event Double Node Upset Tolerance in MOS/Spintronic Sequential and Combinational Logic CircuitsSingle Event Double Node Upset Tolerance in MOS/Spintronic Sequential and Combinational Logic CircuitsSTT-MRAMMagnetic tunnel junction (MTJ)NonvolatilityRadiation...
System and software for verifying that a model of an integrated circuit satisfies its specification includes performing a sequence of at least one sequential transformation on a seq