Advanced MEMs technology measures devices error-free DC Power Our power device probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors up to 600 A and 10,000 V. High Current Probe Test power devices on wafer with high-performance...
Measurement of Mechanical Properties of Al-3%Ti thin film for Design of RF MEMS Switch This paper presents a novel experimental method to investigate the strength of material, Al-3 Ti, which is commonly used in RF(radio frequency) microelectr... Jun-Hyub,Park,Man,... - 대한기계...
The rf-sputtered titanium nitride layer can be made superconductive to develop efficient quantum transducers. Keywords: quantum transduction; hybrid systems; low noise N/MEMS resonators; optomechanics; electro-optics1. Introduction Quantum transduction refers to the process of converting one form of ...