PURPOSE:To obtain a sufficiently large contact pressure by forming the probe card in such a manner that a contactor receives the force in the same direction as the direction of the force when the front end part comes into contact with a terminal to be measured by a prepressing part when ...
The QiLin™ probe card is a workhorse test solution for advanced Wafer Level Chip-scale Packaged (WLCSP) devices with a pitch range of 250-500 μm. Optimized for superior alignment and planarity, the multi-DUT product delivers robust performance with high reliability in aggressive production regi...
1,Section: 3mm x 1mm、and Ф1.0mm 2, Force :1N/20N 3, Length: 80mm 4, Standard: GB2099.1-2008 1N test pin: 20N Test Pin:
使用自动化设备植针,最高达150, 000Pin/Card 去耦电容安装至离被测物最近位置,降低回路电感,拥有更好的接触性能 MEMS探针直接焊接探针至MLC表面,拥有更好的信号完整性 全通道隔离 Full Channel Isolation 刮痕小,落尘量相较传统悬臂式针卡降低80% 优秀的接触阻抗、漏电值等电讯测试能力 ...
A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal ...
The probe card designer determines the wire diameter to be used. Etch Length Etch length is a unit-less number used at the discretion of the probe card designer to vary the contact force. It's defined as the distance from the point where the wire diameter begins to decrease (usually in ...
Supplier Homepage Products IEC&UL accessibility test probe IEC 61032 Standardtest Probe C with Force for Harzardous Live Parts Related Categories Electrical Test Pin Circuit Board Probe Spring Loaded Test Needle Hot Searches Testing Machine Testing Equipment Func...
UL507 PA100 UL Standard Jointed Test Finger Probe Test Pin, Find Details and Price about UL507 IP1X IP2X IP3X IP4X UL980 Test Finger Probe Without Force from UL507 PA100 UL Standard Jointed Test Finger Probe Test Pin - Shenzhen Bonad Instrument Co., Ltd.
7. Full Pin Length:针长 8.Contact Force:探针单位形变产生的压力 9.Max OD:探针能承受的最大受压行程 10.Touch Down(Life):探针测试时与被测物的接触次数,通常也指探针寿命 测试时探针相关 Probe Related When Testiing 11. X.Y Alignment:探针针尖X.Y方向位置度→影响扎针的位置 ...
A force may be applied to the first contact251of the probe pins10that are in a return state (FIG. 5), pressing the first contact part22of the movable pin20into the housing2. As a result, the stepped portion233of the second contact part23of the movable pin20of the probe pins makes ...