Power Grid Analysis in VLSI DesignsShah
Kim, "Analysis of Power Consumption in VLSI Global In- terconnects," Proceedings of the IEEE International Symposium on Circuit and Systems, pp. 4713-4716, May 2005.Shin, Y., Kim, K.O.: Analysis of power consumption in VLSI global interconnects. In: IEEE International Symposium on Cir- ...
Check access to the full text by signing in through your organization. Access through your organization References (8) F.H. Branin The analysis and design of power distribution nets on LSI chips W. Song et al. Power distribution techniques for VLSI circuits J. Solid State Circuits (Feb 1986...
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The areas, power consumptions and securities of S-boxes in various very large scale integrate (VLSI) architectures for advanced encryption standard (AES) were analyzed to give a design basis for a VLSI implementation with constrained resource and more secure applications. Different S-box architectures...
Performance Analysis of Footed Quasi Resistance Scheme for Low Power VLSI Circuits One of the major problem in cascading dynamic circuits is logic 1 to logic 0 transition which is solved by using a simple inverter at output named as domin... TR Sankar,SR Kassa,R.K. Nagaria,... - Internati...
Bandgap Reference (BGR) Circuit Design and Transient Analysis in 90nm VLSI Technology See New Articles >> Most Popular System Verilog Assertions Simplified System Verilog Macro: A Powerful Feature for Design Verification Projects Dynamic Memory Allocation and Fragmentation in C and C++ Optimizing ...
A framework for hypothesis testing and power analysis in the assessment of fit of covariance structure models is presented. We emphasize the value of confidence intervals for fit indices, and we stress the relationship of confidence inte... RC Maccallum,MW Browne,HM Sugawara - 《Psychological Metho...
VLSIsynthesisRTLareathroughputpower dissipationDSPFIR filterWe present a performance analysis framework that efficiently generates and analyzes hardware designs for ... R Hourani,R Jenkal,WR Davis,... - 《Journal of Signal Processing Systems》 被引量: 14发表: 2009年 SST: A Scalable Parallel Framewo...
Heat in VLSI circuits is becoming a significant and related problem. The rate at which physical dimensions such as gate length and gate oxide thickness have been reduced is faster than for other parameters, especially voltage, resulting in higher power densities on the chip surface. To lower leak...