V. Scanning near-field microwave microscopy of VO2 and chemical vapor deposition graphene. Adv. Funct. Mater. 23, 2635-2645 (2013).Tselev, A., Lavrik, N. V., Kolmakov, A. & Kalinin, S. V. Scanning near-field microwave microscopy of VO2 and chemical vapor deposition graphene. Adv. ...
The microwave properties of nano-scale structures are important in a wide variety of applications in quantum technology. Here we describe a low-power cryogenic near-field scanning microwave microscope (NSMM) which maintains nano-scale dielectric contrast
We will present recent work on near- field scanning microwave microscopy. Our microscopes consist of an open-ended coaxial probe which forms one end of a transmission line resonator.(D. E. Steinhauer, et al.), Appl. Phys. Lett. 73 (1998).^,(D. E. Steinhauer, et al.), Appl. Phys....
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A three-dimensional finite element numerical modeling for the scanning microwave microscopy (SMM) setup is applied to study the full-wave quantification of the local material properties of samples. The modeling takes into account the radiation and scattering losses of the nano-sized probe neglected in...
Two scanning probe microscopy techniques—near-field scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)—are used to characterize... A Tselev,A Klein,J Gassmann,... - 《Advanced Materials Interfaces》 被引量: 1发表: 2015年 Quantitative Imaging of Microwave Permittivity, ...
Noncontact characterization of sheet resistance of indium–tin-oxide thin films by using a near-field microwave microprobeIndium tin oxideNear-field scanning microwave microprobeSurface roughnessSheet resistanceThe sheet resistance of indium–tin-oxide (ITO) thin films with different microstructures and ...
Near-Field Optical Microscopy Near-Field Optical Spectroscopy Near-field optics Near-Field Optics Imaging Near-field probe Near-Field Recording Near-Field Scanner Near-Field Scanning Microscope Near-Field Scanning Microwave Microscope Near-Field Scanning Microwave Microscopy Near-field scanning optical microsc...
The basic principle of these near-field scanning microwave microscopy techniques relates to the perturbation of the resonance of a cavity coupled to a probe tip. The probe is a sharpened metal tip mounted in the centre conductor of a coaxial resonator that extends beyond an aperture formed in ...
Near-field microwave scanning probe imaging of conductivity inhomogeneities in CVD graphene. We have performed near-field scanning microwave microscopy (SMM) of graphene grown by chemical vapor deposition. Due to the use of probe-sample capacitive ... A Tselev,NV Lavrik,I Vlassiouk,... - 《...