V. Scanning near-field microwave microscopy of VO2 and chemical vapor deposition graphene. Adv. Funct. Mater. 23, 2635-2645 (2013).Tselev, A., Lavrik, N. V., Kolmakov, A. & Kalinin, S. V. Scanning near-field microwave microscopy of VO2 and chemical vapor deposition graphene. Adv. ...
The microwave properties of nano-scale structures are important in a wide variety of applications in quantum technology. Here we describe a low-power cryogenic near-field scanning microwave microscope (NSMM) which maintains nano-scale dielectric contrast down to the single microwave photon regime, up...
C. Wellstood, "Near-Field Scanning Microwave Microscopy of Superconducting Materials and Devices," in Advances in Superconductivity XI, ed. by N. Koshizuka and S. Tajima, (Springer-Verlag, Tokyo, 1999), pp. 1079.Steven M. Anlage, A. S. Thanawalla, A. P. Zhuravel’, W. Hu, C. P. ...
A three-dimensional finite element numerical modeling for the scanning microwave microscopy (SMM) setup is applied to study the full-wave quantification of the local material properties of samples. The modeling takes into account the radiation and scatte
The authors discuss near-field scanning microwave microscope measurements of the complex permittivity for bulk dielectric (fused silica), semiconductor (silicon), and metal (copper). The authors use these measurements to test existing quasistatic theoretical approach to deembed the bulk material propertie...
We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 μm. The microscope is sensitive to the linear permittivity, as well as to nonlinear dielectric terms, which can be...
2) scanning near field infrared microscopy 扫描近场红外显微镜 1. Tip sample distance control system is the key part ofscanning near field infrared microscopy. 针尖 样品的距离控制系统是扫描近场红外显微镜的重要组成部分。 3) scanning tip microwave near field microscopy ...
3) scanning tip microwave near field microscopy 扫描近场微波显微镜 1. In this paper,the interactions between the tip of the scanning tip microwave near field microscopy and the nonlinear dielectric material were analyzed. 从理论上分析了扫描近场微波显微镜中探针和非线性样品之间的相互作用 ,对非...
The near-field scanning microwave microscope (NSMM) can quantitatively image materials properties at length scales far shorter than the free space wavelength(λ). Here we report a study of the effect of tip geometry on the NSMM signals. This particular NSMM utilizes scanning tunneling microscopy ...
Near-Field Scanning Microwave Microscopy Near-field scanning optical microscope Near-field scanning optical microscopy Near-field scanning optical microscopy Near-Field to Far-Field Transformation NEAR-GOOS Near-Identity Transformation Near-infrared