The sources of the random and systematic errors inherent to this system were also discussed.doi:10.1016/j.optcom.2013.04.065Otsuki, SoichiMurase, NorioKano, HiroshiESOptics CommunicationsMueller matrix microscopic ellipsometer[J] . Soichi Otsuki,Norio Murase,Hiroshi Kano.Optics Communications . 2013
General and Self-Consistent Method for the Calibration of Polarization Modulators, Polarimeters and Mueller-Matrix Ellipsometers. Appl. Opt. 38, 3490–3502 (1999). Article CAS ADS PubMed Google Scholar van Staveren, H. J., Moes, C. J. M., van Marie, J., Prahl, S. A. & van ...
The Mueller matrix\(\underline{\underline{M}}\)of a sample enables its comprehensive polarimetric characterization. Once the Mueller matrix has been measured, the sample’s polarimetric properties can be retrieved by a number of algebraic procedures. In this study, we made the choice to interpret ...
PROBLEM TO BE SOLVED: To provide a Mueller matrix microscopic ellipsometer capable of measuring the Mueller matrix of a sample if either one of an irradiation optical system side and a detection optical system side includes an active element.OTSUKI SOICHI大槻 荘一...
General and self-consistent method for the calibration of polarization modulators, polarimeters, and Mueller-matrix ellipsometers. Appl. Opt. 1999, 38, 3490–3502. [Google Scholar] [CrossRef] Laude-Boulesteix, B.; De Martino, A.; Drevillon, B.; Schwartz, L. Mueller polarimetric imaging ...