PROBLEM TO BE SOLVED: To provide a Mueller matrix microscopic ellipsometer capable of measuring the Mueller matrix of a sample if either one of an irradiation optical system side and a detection optical system side includes an active element.OTSUKI SOICHI大槻 荘一...
imaging techniques and adopt the Mueller matrix imaging ellipsometry (MMIE) for fast, large-scale and accurate nanostructure metrology. A spectroscopic Mueller matrix imaging ellipsometer is developed in our laboratory by substituting a complementary metal oxi 著录项 来源 2016年第7期|070703-1-070703-11...
General and Self-Consistent Method for the Calibration of Polarization Modulators, Polarimeters and Mueller-Matrix Ellipsometers. Appl. Opt. 38, 3490–3502 (1999). Article CAS ADS PubMed Google Scholar van Staveren, H. J., Moes, C. J. M., van Marie, J., Prahl, S. A. & van ...
The Mueller matrix\(\underline{\underline{M}}\)of a sample enables its comprehensive polarimetric characterization. Once the Mueller matrix has been measured, the sample’s polarimetric properties can be retrieved by a number of algebraic procedures. In this study, we made the choice to interpret ...
The sources of the random and systematic errors inherent to this system were also discussed.doi:10.1016/j.optcom.2013.04.065Otsuki, SoichiMurase, NorioKano, HiroshiESOptics CommunicationsMueller matrix microscopic ellipsometer[J] . Soichi Otsuki,Norio Murase,Hiroshi Kano.Optics Communications . 2013...
The review contains a systematization of the main approaches to the practical implementation of Mueller matrix polarimetry and the prospects for its application in biology and agriculture. The most typical optical layouts for measuring the Mueller matrix
Keywords: Mueller matrix; Mueller microscopic imaging; calibration 1. Introduction The technique of polarized light imaging can provide microstructural information on samples, and the Mueller matrix offers a comprehensive description of the polarization properties of samples. Therefore, when the polarized lig...
General and self-consistent method for the calibration of polarization modulators, polarimeters, and Mueller-matrix ellipsometers. Appl. Opt. 1999, 38, 3490–3502. [Google Scholar] [CrossRef] Laude-Boulesteix, B.; De Martino, A.; Drevillon, B.; Schwartz, L. Mueller polarimetric imaging ...