Original Creation Date: 04/29/03Last Update Date: 05/13/03Last Major Revision Date:MNLMH6628-X-RH REV 0A0MICROCIRCUIT DATA SHEETDUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP,GUARANTEED TO 300k rd(Si) TESTED TO MIL-STD-883,METHOD 1019General Descripti
LM136AH 110Kb / 8P 2.5V REFERENCE DIODE, GUARANTEED TO 100K RADSi TESTED TO MIL-STD-883, METHOD 1019.5 MNLMH6628-X-RH 176Kb / 12P DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 M.S. Kennedy Corporatio... MSK...
Test Method (TM) 1014, Seal Test, has incorporated proposed Appendix A for Cumulative Helium Leak Test as an optional procedure. 2. TM 1018, Internal Gas Analysis, is replaced with an identical method to that within MIL-STD-750. 3. TM 1019, Ionization Radiation (Total Dose), has been ...
42 1 M 1032 Para 2.2 Replace "military" with "test method". 43 1 M 1033 Para 3.1 Replace "detail drawing" with "device specification or drawing". 44 * 5 M 2003 Para 4.5 Add criteria for Equipment manufacturer cleaning of carbonate/sulfate ...
内容提示: CHANGES TO REVISION E OF MIL-STD-883 26 December 1996Military/ IndustryNumber Page123456METHODChangei Cover Page Change to a "Test Method Standard Microcircuits"iiForward2. Change to Columbus AddressivMethod 2015.11 Method revised1Para 1.1 Line 4 deleted "environmental" Redundant, already...
部件名: MNDS26F32MJR-QML. 功能描述: QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A. Page: 12. 制造商: National Semiconductor (TI).