JEDEC JESD22-B108B-2010 下载积分: 2500 内容提示: JEDEC STANDARD Coplanarity Test for Surface-Mount Semiconductor Devices JESD22-B108B (Revision of JESD22-B108A, January 2003) SEPTEMBER 2010 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION ... 文档格式:PDF | 页数:14 | 浏览次数:622 | 上传日期:2020-...
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JESD22-B108A-Y2003贴装半导体元器件平面度测试
JESD22-B108A-Y2003贴装半导体元器件平面度测试.pdf,JEDEC STANDARD Coplanarity Test for Surface-Mount Semiconductor Devices JESD22-B108A - -` (Revision of JESD22-B108) ` , - ` - ` , , ` , , ` , ` , , ` - - - JANUARY 2003 JEDEC SOLID STATE TECHNOLOGY ASSOCIA
JESD22-B108B Coplanarity Test for Surface-Mount Semiconductor Devices 表贴半导体器件的共面性试验.pdf,JEDEC STANDARD Coplanarity Test for Surface-Mount Semiconductor Devices JESD22-B108B (Revision of JESD22-B108A, January 2003) SEPTEMBER 2010 JEDEC SOLID
JESD22-B108A平整度
JEDEC STANDARD Coplanarity Test for SurfaceMount Semiconductor Devices JESD22B108A Revision of JESD22B108 JANUARY 2003 J,人人文库,
国际标准分类中,jesd22-b108涉及到半导体分立器件、信息技术应用。在中国标准分类中,jesd22-b108涉及到通用电子测量仪器设备及系统、基础标准与通用方法。未注明发布机构,关于jesd22-b108的标准JEDEC JESD22-B104C-2004(2009) 机械冲击试验方法 JESD22-B104C (修订自JESD22-B104-B) JEDEC JESD22-B105E-2018 JESD...
JEDEC JESD22-B108B-2010的仪器谱信息,表面贴装半导体器件的共面性测试, Coplanarity Test for Surface-Mount Semiconductor Devices, 提供JEDEC JESD22-B108B-2010的发布时间、引用、替代关系、发布机构、适用范围等信息,也提供
JESD22-B108A-Y2003贴装半导体元器件平面度测试