JESD22-A108 数据表 (HTML) - Broadcom Corporation. 部件名JESD22-A108 下载JESD22-A108下载 文件大小147.11 Kbytes 页2 Pages 制造商BOARDCOM [Broadcom Corporation.] 网页http://www.broadcom.com 标志 功能描述3mmYellowGaAsP/GaPLEDLamps 类似零件编号 - JESD22-A108...
功能描述3mmYellowGaAsP/GaPLEDLamps 类似零件编号 - JESD22-A108 制造商部件名数据表功能描述 Broadcom Corporation.JESD22-A108 147Kb/2P3mm Yellow GaAsP/GaP LED Lamps Richtek Technology Corp...JESD22-A108 34Kb/2PRichtek Technology Corporation More results 链接网址...
JESD22-A108 下载积分: 100 内容提示: JEDEC STANDARD Temperature, Bias, and Operating Life JESD22-A108-B (Revision of JESD22-A108-A) DECEMBER 2000 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION 文档格式:PDF | 页数:11 | 浏览次数:1000 | 上传日期:2015-03-09 14:34:45 | 文档星级: ...
内容提示: JEDEC STANDARD Temperature, Bias, and Operating Life JESD22-A108G (Revision of JESD22-A108F dated July 2017) NOVEMBER 2022 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION Downloaded by wilson Wang (cmdz001@163.com) on Nov 29, 2022, 5:59 pm PSThanrun inc. 文档格式:PDF | 页数:14 ...
JESD22-A108C_2005_Temperature,_Bias,_and_Operating_Life温度,偏压和使用寿命.pdf,JEDEC STANDARD Temperature, Bias, and Operating Life JESD22-A108C (Revision of JESD22-A108-B) JUNE 2005 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and pu
部件名: JESD22-A108. 功能描述: 3mm Yellow GaAsP/GaP LED Lamps. 文件大小: 147.11 Kbytes. 制造商: AVAGO TECHNOLOGIES LIMITED.
A108 TEMPERATURE,BIAS,ANDOPERATINGLIFE:温度,偏置电压,以及工作寿命: Arevisedmethodfordeterminingtheeffectsofbiasconditionsand本标准提供了一个可用的经修订的试验方法,用于确定偏置条 temperature,overtime,onsolidstatedevicesisnowavailable.Revi-件和温度在长时间下对固态器件的作用。A108修订版B包括了温度,偏置电 sio...
预览PDFDownloadHTMLChat AI 部件名JESD22-A108 功能描述3mmYellowGaAsP/GaPLEDLamps Download2 Pages Scroll/Zoom 100% 制造商BOARDCOM [Broadcom Corporation.] 网页http://www.broadcom.com 标志 类似零件编号 - JESD22-A108 制造商部件名数据表功能描述 ...
(RevisionofTestMethodA108-B) TEST METHOD A108C TEMPERATURE, BIAS, AND OPERATING LIFE (From JEDEC Board Ballots JCB-99-89, JCB-99-89A, and JCB-05-49, formulated under the cognizance of JC-14.1 Committee on Reliability Test Methods for Packaged Devices.) ...
(Revision of Test Method A108-B) TEST METHOD A108C TEMPERATURE, BIAS, AND OPERATING LIFE (From JEDEC Board Ballots JCB-99-89, JCB-99-89A, and JCB-05-49, formulated under the cognizance of JC-14.1 Committee on Reliability Test Methods for Packaged Devices.) ...