An Approach to Measure the Performance Impact of Dynamic Voltage Fluctuations Using Static Timing Analysis Design closure for predictable silicon performance is emerging as the most challenging digital VLSI design problem in advanced deep-submicron technology no... R Vishweshwara,R Venkatraman,H Udayakuma...
Effect of IR-Drop on Path Delay Testing Using Statistical Analysis IR-drop has become a major source of delay defects in deep sub-micron VLSI designs. In this work, we analyze the effect of IR-drop in path-delay test and how to obtain more accurate delay information of critical paths. Fo...
Data mining and web-based reporting software for power, IR drop and EM analysis in VLSI designdoi:10.1109/ictus.2017.8286028Qing ZhuIEEEInternational Conference on Computer Communications
Research Interests: The design and analysis of efficient algorithms for optimization problems from many application areas, including VLSI CAD, Transportation Logistics, Multimedia Video Processing, and most recently, Bioinformatics and Computational Biology. Longkai W...
VLSI P/G网的瞬态IR-drop分析 3. Pulse Shaping Designing & the Performance Analysis of the IR-UWB System IR-UWB脉冲成形设计及系统性能分析 4. The Analysis of IR-drop and Thermal Reliability for Power/Ground Network P/G网的IR-drop压降和热可靠性分析 ...
Thermal modeling and analysis of 3D multi-processor chips As 3D chip multi-processors (3D-CMPs) become the main trend in processor development, various thermal management strategies have been recently proposed to ... José,L.,Ayala,... - 《Integration the Vlsi Journal》 被引量: 43发表: 2010...
? Principle of spacial locality and error correction windows are utilized. Localized power grid analysis is significantly faster. 展开 关键词: IR voltage drop power distribution network locality closed-form expression DOI: 10.1016/j.vlsi.2011.09.003 被引量: 40 ...
Through the analysis of P/G networks with time-varying current sources, it is found that decoupling capacitors can effectively optimize IR-drop. In order to achieve a more 西安电子科技大学硕士学位论文 IV cooperative layout between the decoupling capacitor and the voltage source, a concept of ...
As per the above analysis, the proposed buffer cell is capable to fix the HOLD violations more efficiently as compared to the existing buffer cells & saves area, power & routing effort. Generally designers are chasing the high performance targets. All designs can use the proposed design architect...
Hillock and void formation in an interconnect. Image used courtesy ofTeam VLSI EM has becomea power integrity issueas ICs have scaled because EM directly results from current density (current per area). As technology nodes shrink, so does the cross-sectional area of th...