PURPOSE:To realize both follow-up and improvement in image quality by providing a means for performing interframe integration with an integration degree according to either a change in frame units or change in observation conditions between image data and integrated image data. CONSTITUTION:A subtract...
摘要: PROBLEM TO BE SOLVED: To solve a problem where an error is generated in dimension management by scanning distortion of an electron beam.收藏 引用 批量引用 报错 分享 文库来源 其他来源 求助全文 SCANNING ELECTRON MICROSCOPE, AND DISTORTION CALIB 优质文献 ...
Scanning electron microscope images of the fabricated device are shown in Fig. 5c. We note here that the design goals of the random scattering medium for this application are significantly different compared with prior applications of on-chip scattering media such as the speckle spectrometer reported...
A TECHNIQUE has been developed for observing monochromatic Cathodoluminescence from semiconductors in the scanning electron microscope, enabling optical micro-analysis of materials to be carried out in a manner analogous to the electron probe X-ray microanalyser. The experimental arrangement is shown in F...
To study the nonlinear relationship between cemented paste backfill (CPB) and mechanical response, a deep learning technique is employed to establish the end-to-end mapping relationship between the scanning electron microscope (SEM) images and mechanical strength. A seven-layer convolution neural ...
(5Csλ)1/2; for the first of these values, known as the Scherzer defocus, the zero occurs at the spatial frequency (Csλ3)−1/4; the reciprocal of this multiplied by one of various factors has long been regarded as the resolution limit of the electron microscope, but transfer ...
3D reconstruction for a scanning electron microscope An algorithm for the reconstruction of the 3D shape of the surface of a micro-object from a stereo pair of images obtained on a raster electron microscope ... AA Zolotukhin,IV Safonov… - 《Pattern Recognition & Image Analysis》 被引量: ...
This paper describes a high resolution scanning transmission electron microscope data collection, storage, and display system. Included are a novel analog‐to‐digital converter, a digital hardware divider, a direct memory access interface to a PDP 11/20, a flicker‐free gray scale TV display, two...
The contrast-to-noise ratio (CNR) is presented and characterized as a tool for quantitative noise measurement of scanning electron microscope (SEM) images. Analogies as well as differences between the CNR and the widely used signal-to-noise ratio (SNR) are analytically and experimentally investigate...
exchange is done between observation by a fluorescent plate and that by a display, by controlling an excitation current in a lens system so as to interlock with mounting/dismounting of the fluorescent plate so that a projection multiplying factor of an electron microscope image is automatically ...