Device Performance of Silicon Nanotube Field Effect Transistor D. Tekleab, "Device performance of silicon nanotube field effect transis- tor," IEEE Electron Device Lett., vol. 35, no. 5, pp. 506-508, May ... Tekleab,D. - 《IEEE Electron Device Letters》 被引量: 15发表: 2014年 Correc...
IEEE Electron Device Letters Volume 40, Issue 12 December 2019 Skyrmion-Based Ultra-Low Power Electric-Field-Controlled Reconfigurable (SUPER) Logic Gate Zhizhong Zhang, Yuanzhi Zhu, Yue Zhang*, Kun Zhang, Jiang Nan, Zhenyi Zheng, Youguang Zhang, and Weisheng Zhao* Beijing Advanced Innovation ...
Device and Materials Reliability * IEEE Transactions on Dielectrics and Electrical Insulation * IEEE Transactions on Education * IEEE/ECS Electrochemical and Solid-State Letters * IEEE Transactions on Electromagnetic Compatibility * IEEE Electron Device Letters * IEEE Transactions on Electron Devices * IEEE...
- 《Electron Device Letters IEEE》 被引量: 27发表: 1984年 Device Performance of Silicon Nanotube Field Effect Transistor D. Tekleab, "Device performance of silicon nanotube field effect transis- tor," IEEE Electron Device Lett., vol. 35, no. 5, pp. 506-508, May ... Tekleab,D. - ...
- 《IEEE Trans Electron Device Lett》 被引量: 1179发表: 1997年 Lo, S.-H , Buchanan, D. A. , Taur, Y. & Wang, W. Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMO... Quantum-mechanical modeling of electron tunneling current from...
Device and Materials Reliability * IEEE Transactions on Dielectrics and Electrical Insulation * IEEE Transactions on Education * IEEE/ECS Electrochemical and Solid-State Letters * IEEE Transactions on Electromagnetic Compatibility * IEEE Electron Device Letters * IEEE Transactions on Electron Devices * IEEE...
Device and Materials Reliability * IEEE Transactions on Dielectrics and Electrical Insulation * IEEE Transactions on Education * IEEE/ECS Electrochemical and Solid-State Letters * IEEE Transactions on Electromagnetic Compatibility * IEEE Electron Device Letters * IEEE Transactions on Electron Devices * IEEE...