By sector number-dependent calculations for both Cc/C3-corrected and C3-corrected scanning transmission electron microscopy (STEM), we show that the increase of detector sectors not only removes the anisotropy of the CTF, but also improves image contrast and resolution. For a proof-of-principle ...
Second, its ability to image both light and heavy elements together [2, 3, 4], long range fields (such as strain and build in contact potentials), metallization and thickness variations, both for amorphous and crystalline materials, thin as well as thick samples [5] will be demonstrated. Fo...
Customarily this information is obtained using Holography or by performing focus series reconstruction in TEM (FSR-TEM), recently also in combination with Phase Plates (PP) and/or image Cs correction. Ptychographic reconstruction has also been considered as an alternative. We present, a new ...