Scanning Electron Microscope FlexSEM 1000 II FlexSEM 1000 II employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Optional...
Scanning Electron Microscope FlexSEM 1000 II Language FlexSEM 1000 II The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology and circuitry provides ...
Ultra-high Resolution Scanning Electron Microscope SU9000II The SU9000 achieved the world’s highest resolution*1of 0.4 nm at 30 kV accelerating voltage through a large number of fundamental performance enhancements including a high-brightness electron gun and a low-aberration lens. ...
1.0nm Resolution at 15kV 200mm specimen diameter. This allows HTE Labs to provide Scanning Electron Microscopy SEM imaging services on whole wafers with sizes 1in, 2in, 3in, 4in, 5in, 6in, 8in [25mm, 50mm, 75mm, 100mm, 125mm, 150mm, 200mm]. Scanning Electron Microscopy...
Official website of Hitachi, Ltd. Hitachi drives Social Innovation Business, creating a sustainable society with data and technology. We will solve customers' and society's challenges with Lumada solutions leveraging IT, OT (Operational Technology) and p
The revolutionary CFE-SEM platform of the latest Hitachi ultrahigh-resolution cold-field emission scanning electron microscope SU8600 incorporates multifaceted imaging, improved system stability, and efficient workflows for users of all levels.
High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus SE Series Offering a Combination of High Performance and Versatility The SU3900SE/SU3800SE Series Microscopes are FE-SEMs that offer high-resolution observation capabilities. They combine easy data acquisition throu...
S 4800 Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/result/s 4800 scanning electron microscope/product/Hitachi Lt...
A high resolution, field emission scanning electron microscope—the Hitachi Perkin Elmer HFS-2doi:10.1016/0047-7206(72)90029-5MicronRis, H. (1997) High resolution field-emission scanning electron microscopy of nuclear pore complex, Scanning 19, 368-375....
The advanced detection system of the SU7000 streamlines acquisition of structural, topographical, compositional, crystallographic, and other types of information by minimizing changes to microscope conditions, such as working distance or accelerating voltage. ...