High-Current Test Probes PCB Probes ICT/FCT Probes Semiconductor probes High-Current Probes CP3.55,CP4.2 High-Current probes,CP265-H30-M2 HomeUpper1NextLast Recommendation information Types of probes, The precision probe to replace the traditional probe Test probe advantage What is the pr...
Normal stroke high current test probes as same as normal probe diamension, can carry the over high current on power or battery test. Screwing high current test probes are designed with screws, It makes the spring contact probes tightly screwed into the receptacle to keep current stable. ...
6A current probe with round head tip probe SF-420 BY 4850-D: plastic bag, standard box, standard carton Selling Units: Single item Single package size: 5X0.3X0.3 cm Single gross weight: 0.050 kg Show more Lead time Customization Know your supplier ...
Test system that gives the high current test stimulus chip form semiconductor device and wafer (4,10,20), apparatus, method, a plurality of probes electrically coupled to respective contact point (3) in a semiconductor device (2) When I include (6) current sensors are electrically coupled to...
The TESLA200 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables collection of accurate high voltage and high current measurement data, with complete operator safety. Downloads High-Power Probes Data Sheet ...
MPI high power probing solutions include dedicated high voltage, and high current probes, which use MPI propriety multi-contact tips for reduced contact resistance. MPI’s high voltage probes are capable of low leakage current measurements during high voltage tests up to 3 kV triaxial or 5 kV &...
A test probe for a high-frequency device having an electronic circuit with two or more contact regions. The test probe comprises two or more signal probe tips. Each signal probe tip has a contact surface area for contacting one of the contact regions of the device. A ground probe has a ...
TS150-HP/TS200-HP can be configured with variety of instrument connection packages, which consists of necessary high voltage / high current probes and cabling accessories for optimal connection to the test instruments such as Keysight B1505 (3 kV or 10 kV) or Keithley 2600-PCT-XB...
The current femtosecond laser fabrication of sapphire fiber grating (SFBG) is mainly divided into four types: phase mask technology, Talbot interferometer technology, femtosecond laser point-by-point inscription method, and femtosecond laser line-by-line inscription method. This section will introduce ...
The distance between the probes in both configurations plays an important in measuring the conductivity [213]. It has been reported that the two-probe configuration can be used for high-resistance materials because of the negligible impedance in the circuit. On the other hand, the four-probe ...