As a general rule, for better than 2% accurate amplitude measurements, the probe and signal-capturing instruments should have a bandwidth five times greater than the highest frequency of thesignal being measured.[5]by Grant SmithTexas Instruments...
The high speed A/D converters in the Series 265xA High Power System SourceMeter® SMUs and the 2460 High Current SourceMeter SMU instruments are useful for monitoring the voltages and currents at the device as they relate to time. Figure 5 depicts the results of a pulse transient ...
Picosecond excite and probe optical beam induced current method for investigation of high speed integrated circuits 来自 Semantic Scholar 喜欢 0 阅读量: 37 作者:H Bergner,K Hempel,U Stamm 摘要: A pump and probe beam technique is demonstrated in conjunction with the optical beam induced current ...
Fig. 1: sCMOS high-speed acquisition with pixel reassignment (sHAPR). aSchematic of the experimental setup. DM dichroic mirror, TL tube lens, OL objective lens, IL illumination lamp, FC fiber coupler, FC-IA fiber coupler input array, FC-OA fiber coupler output array, C camera, CL camera...
Array High Speed Test - DaVinci Series Innovative IM material to permit a truly coaxial structure from tip to tip allowing for industry leading yields in a highly compliant contactor. Array High Speed Test - DaVinci 112 DaVinci 112 increases production yields and throughput, e...
At high speed, the long ground lead looks inductive, causing the ringing shown. High quality probes are always supplied with some short ground straps to deal with this problem. Some come with very short spring clips that fix directly to the probe tip to facilitate a low impedance ground ...
Keysight EDA 2025 for High-Speed Digital Design Keysight EDA 2025 offers new and advanced capabilities for achieving faster design confidence in high-speed digital applications. Keysight EDA’s Advanced Design System (ADS) provides a powerful, integrated design and simulation environment to create digita...
In high-speed system developments, the ubiquitous 10-pF 10:1 capacitive-input probe is no longer adequate. The two alternatives are the FET-input probe a...
2. Using 32-bit ARM control chip controller: faster computing speed, effectively reducing the winding error. 3. Reduced waste: Power-off saves winding data, effectively avoiding scrap coil. So whether you are a manufacturer of high-frequency transformers wind...
2.The integrated high-speed probe system of claim 1, wherein a metal plate is further disposed on the locating base, and the metal plate electrically connects the grounding probe;each first probe electrically connects one corresponding first probe contact of the circuit substrate; each second probe...