Optical Microscopy Facility, National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL, USAJohn Wiley & Sons, LtdMichael Spencer. Fundamentals of light microscopy. pages 32-38,Cambridge University PressJ982.Spencer, M. 1982. Fundamentals of light microscopy. Cambridge University...
Over the last decade, advances in science and technology have profoundly changed the face of light microscopy. Research scientists need to learn new skills in order to use a modern research microscope–skills such as how to align microscope optics and perform image processing. Fundamentals of Light...
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FUNDAMENTALS OF LIGHT MICROSCOPY AND ELECTRONIC IMAGING "This book will provide individuals without background knowledge in optical physics, electronics, or image processing with many of the basic facts they nee... A Telser - 《Shock》 被引量: 450发表: 2002年 Fundamentals of Light Microscopy and...
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Fundamentals of Light Microscopy and Electronic Imaging explores the basics of microscope design and use. The comprehensive material discusses the optical principles involved in diffraction and image formation in the light microscope, the basic modes of light microscopy, the components of modern electronic...
Fundamentals of Light Microscopy and Electronic Imaging 2024 pdf epub mobi 电子书 图书描述 Over the last decade, advances in science and technology have profoundly changed the face of light microscopy. Research scientists need to learn new skills in order to use a modern research microscope–skills...
Murphy, D.B., Fundamentals of Light Microscopy and Electronic Imaging, John Wiley and Sons (2001). Ntziachristos, V., "Fluorescence molecular imaging," Annu Rev Biomed Eng (2006) 8:1–32. Patterson, G., Davidson, M., Manley, S. and Lippincott-Schwartz, J., “Superresoluti...
Fundamentals of Scanning Electron Microscopy (SEM). In: Zhou W, Wang ZL. Scanning Microscopy for Nanotechnology: Techniques and Applications. New York, NY: Springer New York. 2007: 1-40.Zhou W, Apkarian R, Wang ZL, Joy D. Fundamentals of scanning electron microscopy (SEM). In: Zhou W, ...
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