We have to analyze timing under different range of conditions, typically quantified as modes (test mode, functional mode) and corner (PVT). The number of combinations (timing views) you have to run is typically
It also offers three operation modes: full system emulation mode, where the processor architecture and other peripheral devices are emulated; user mode emulation, where Qemu can launch executables compiled for one processor on another host processor which could have a completely different architecture; ...
A chip-set has been defined that implements the FANN, while it allows for expandability in the number of its inputs and outputs, as well as the number of neurons and connections in each hidden layer. Use of current-mode circuitry has resulted in compact multiplication circuitry and efficient ...
While in Decode Mode, the ADV601LC accepts a compressed bit stream through the Host Interface and outputs component digital video through the Video Interface. The host accesses all of the ADV601LC's con- trol and status registers using the Host Interface. Figure 1 sum- marizes the basic ...
1. A method for operating a wireless communications device, comprising operations of: providing multiple static objects fixed in circuitry of the device, each static object associated with a unique Object ID, each static object having a predefined entry point; providing a static object table correlat...
Stuck-open and stuck-short faults model the switch being permanently in either the open or the short state. They assume only one transistor is in stuck-open or stuck-short mode. The effect of a stuck-open fault is a floating state at the output of the faulty logic gate. It can be ...
When such a dual-functional device is operated in the MS mode, it is used for the non-volatile memory storage; when it is operated in the TS mode, it is a bi-directional selector device. The flexibility and simplicity for the MS and TS applications in a single device is beneficial for...
In loosely timed mode, modelling the virtual platforms focuses on functionality of the cores and peripherals and doesn’t carry actual timing information. This mode is preferred when requirement is to develop and verify driver, application & verification software. Loosely timed mode is ...
5471482VLSI embedded RAM test1995-11-28Byers et al.714/719 5436910Dynamic random access memory device having a parallel testing mode for producing arbitrary test pattern1995-07-25Takeshima et al.714/718 5250940Multi-mode home terminal system that utilizes a single embedded general purpose/DSP proces...
A circuit for the operation of an integrated circuit, optionally in a test operation mode or a functional operation mode, has external connections, inner nodes and a test bus. In known circuits of this type, switching between a plurality of test buses and function buses for the testing of th...