fault coveragefunctional testingfunctional-level test generationDuring the design cycle of VLSI circuits, test vector generation is often a very time consuming and costly step.Many strategies concerning automatic test pattern generation have been published. Usually they are restrictive and consider the ...
There are three main components in a testbench as shown in Figure 1: (1) stimulus to activate the DUV; (2) a set of coverpoints to observe the behavior of the DUV and collect coverage information; and (3) a set of checkers to check internal states and outputs of the DUV. To ...
5.28. The columns refer to various types of test coverage: block refers to basic blocks, decision refers to conditionals, P-use refers to the use of a variable in a predicate (decision), and C-use refers to variable use in a nonpredicate computation. These results are at least suggestive...
Circumvents all coverage problems, • Quantifies the timing margins on all signal propagation paths, both short and long, • Locates slack, if any, and • Does with a more reasonable computational effort. Do not forget to include layout parasitics, to use adequate interconnect models, and...
3.Based on conventional approaches infunctional verificationthis article introduces coverage-rate as a feedback to show the grade of verification.针对功能验证的特点,在传统功能验证的基础上,引入覆盖率作为验证程度的反馈信息,从而有针对性地完善了验证环境,提高了验证程度。
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A method for presentation of functional coverage includes representing a set of attributes of a design under test as a multi-dimensional cross-product space, which includes events c
Coverage-driven Approach in Functional Verification; 基于覆盖率的功能验证方法 3. Based on conventional approaches in functional verification this article introduces coverage-rate as a feedback to show the grade of verification. 针对功能验证的特点,在传统功能验证的基础上,引入覆盖率作为验证程度的反馈信...
1. Research on Techniques of VLSI RT-Level Automatic Functional Vectors Generation; VLSI RTL级模拟矢量自动生成技术研究2. This paper proposes a novel assertion-based automatic functional vectors generation method which takes assertion as the functional coverage metric. 采用断言作为模拟验证的功能模型,...
Y. Jou, "Functional Test Generation for Finite State Machines", in Proc. Intl. Test Conf., 1990, pp. 162-168. [11] I. Pomeranz and S. M. Reddy, "On Achieving Complete Fault Coverage for Sequential Machines", IEEE Trans. on Computer-Aided Design, March 1994, pp. 378-386. [12] ...