McNaughton, "Empirical Failure Analysis and Validation of Fault Models in CMOS VLSI," Proc. 1990 h t . Test Conf., pp. 938-946, 1990.A. Pancholy, J . Rajski and L. J . Mcnaughton, "Empirical failure analysis and validation of fault models in CMOS VLSI circuits," IEEE De- sign ...
With the advent of VLSI circuits, exhaustive functional testing has become unfeasible and has led to the appearance of structural tests aimed at detecting possible faulty conditions [16]. Such conditions have to be modeled by fault models. A fault model is a systematic and precise representation ...
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies, RISC-V architectures and AI-based solutions. One of the unique features of this symposium is to combine new academic...
© 2001 Agrawal, BushnellMay 22, 2010, Agrawal: Lecture 3 Fault Simulation5 Fault Simulation Scenario n Circuit model: mixed-level n Mostly logic with some switch-level for high-impedance (Z) and bidirectional signals n High-level models (memory, etc.) with pin faults n Signal states: log...
Defect/Fault analysis and models; statistical yield modeling; critical area and other metrics. Testing Techniques Built-in self-test; delay fault modeling and diagnosis; testing for analog and mixed circuits; signal and clock integrity. Error Detection, Correction, and Recovery ...
In addition,one must gain working knowledge of models used in testing of memory (Chapter 9) and analog circuits (Chapters 10 and 11.) Fault models most likely to gain significance in the near future are the delay fault models discussed in Chapter 12....
A Test Evaluation Technique for VLSI Circuits Using Register-Transfer Level Fault Modeling. Stratified fault sampling is used in register transfer level (RTL) fault simulation to estimate the gate-level fault coverage of given test patterns. RTL f... Thaker,A Pradip,Agrawal,... - IEEE Transactio...
摘要: This paper presents analytical and simulation models for evaluating the operation of a VLSI processor (in a uniprocessor configuration) which utilizes a time-redundant approach (such as recomputation by shifted operands) for fault-tolerant computing...关键...
A fault-analysis oriented methodology is presented in this work to help users develop and evaluate re-design methods for their applications. In the proposed methodology, selection of fault models and implementation of fault injection and evaluation processes is addressed. According to the evaluation ...
but several orders faster than D-algorithm More efficient algorithms available – FAN, Socrates, etc. See, M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Springer, 2000, Chapter 7. © 2001 Agrawal, Bushnell May 22, ...