logic testingCADD-algorithmSPARKVLSIcircuit topologyA method is presented to identify and locate a fault in combinational logic circuits. A test pattern generator (called SPARK) has been developed, based on a modified version of the D-algorithm. A fault dictionary is set up during test generation...
In order to ensure robust fluidic operations and high confidence in the outcome of biochemical experiments, MEDA biochips must be adequately tested before they can be used for bioassay execution. This chapter presents the first approach for testing of ME
3.The faults overlap circumstances in analog fault diagnosis are analyzed.分析了模拟电路故障诊断中故障类重叠。 4.Fault Dictionary Method in Analog Circuit Fault Diagnosis;模拟电路故障诊断中故障字典应用的研究 5.The Research of Fault Simulator for I_(DDT) Testing;I_(DDT)测试故障模拟器的研究 6.The...
This paper presents a novel methodology to explore unified biometrics with encoded dictionary for hardware security of fault secured digital signal processing (DSP) intellectual property (IP) core designs against piracy. The proposed security approach exploits scheduled and allocated DSP design using behavi...
3 VLSIFaultDiagnosis(inOneSlide)DefectiveCircuitTestsObservedBehavior LocationorFault PhysicalAnalysis Diagnosis DiagnosisAlgorithm TwoTypesofDiagnosis •CircuitPartitioning(“Effect-Cause”Diagnosis)–Identifyfault-freeorpossibly-faultyportions–Identifysuspectcomponents,logicblocks,interconnects•Model-BasedDiagnosis(...
Manual isolation is time consuming and very costly in terms of labor expenses. Fault dictionary isolation is not accurate enough to isolate to a single bad node or part. Guided probing is not allowed in some applications (such as a Navy depot test, for example), and is not possible in som...
A control system has a first module that includes a memory and diagnostic logic. The diagnostic logic periodically tests at least selected locations in the memory and, in connection with such testing,
Analog testingfault diagnosisfault dictionaryFast Fourier Transform (FFTpower consumptionopencircuit faultIn this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the use of afault dictionary approach. This technique allows the detection and localization of the most ...
Such faults may be compiled into a fault dictionary which may be collapsed by identifying groups of faults which result in the same overall measurable circuit behaviour.Dorey, A.P.Silvester, P.J.Institute of Electric and Electronic Engineer...
Williams, "On the decline of testing efficiency as fault coverage approaches 100%", in Proc. IEEE VLSI Test Symp., pp. 74-83, 1995.On the decline of testing efficiency as fault coverage approaches 100 - Wang, Mercer, et al. - 1995 () Citation Context ... to the identification of ...