美 英 un.深度剖面 网络深度剖面图 英汉 网络释义 un. 1. 深度剖面 释义: 全部,深度剖面,深度剖面图
网络释义 1. 深度剖面分析 ...( Bulk Analysis) , 近年来 辉光深度剖面分析(Depth Profile Analysis) 技术被应用于 材料表面分析领域而日益受到人们的重视 ... wenku.baidu.com|基于3个网页 2. 深度逐层分析 ... ) lay-er-by-layer analysis 逐层成分分析 )depth profile analysis深度逐层分析) Puff-by-...
Factors to consider when setting up a depth profile include the following: Beam energy: high for speed low for resolution Incidence angle (with respect to sample normal): High for smooth samples or low for rough samples lon mass: large mass helps depth resolution - Xe is expen...
In beam-based PALS a focused beam of several keV positrons forms positronium (Ps, the electron–positron bound state) with a depth distribution (typically 5 nm–5 μm) that depends on the selected positron beam energy. Ps localizes in the pores where its natural annihilation lifetime of ...
The analytical parameters were optimized for the RF-GD-OES depth quantitative analysis of Cr/Ni multilayers on a Si substrate. To validate the RF-GD-OES results, a TEM image was obtained in addition to performing the AES and SIMS depth profiling. confirm the validity of the GD-OES data, ...
Modelling the evolution of the concentration of in-situ produced cosmogenic nuclides as a function of depth (depth-profile) has been developed to allow determining both the exposure duration and the denudation rate affecting geomorphic features. However, material sampled through surficial deposits may ...
最近在做和这个有关的项目,主要包括锆石U/Pb年龄和微量元素的profile测定,感觉能找到的文献很少呀,不知道有没有人也在做这方面,交流一下!
Real-time depth profile reconstruction of the thermal conductivity of inhomogenous solids. Proposes a method used to derive the one-dimensional temperature distribution in a highly absorbing solid with continuously varying parameters. Information... Kolarov,R.,Velinov,... - 《Journal of Applied Physic...
网络释义 1. 温度深度层次图 台湾土木工程词... ... temperature correction 温度改正 temperature depth profile 温度深度层次图 temperature index 温度指数 ... www.foodmate.net|基于9个网页 例句 释义: 全部,温度深度层次图 更多例句筛选 1. Modeling of Temperature Depth Profile of Float Glass in Shaping ...
In this work we have assessed the capability of depth profile analysis by glow discharge mass spectrometry (GD-MS) for several impurities relevant for solar cell silicon. A fast-flow direct-current high resolution GD-MS has been used. Six multicrystalline p-type silicon samples with contamination...