美 英 un.深度剖面 网络深度剖面图 英汉 网络释义 un. 1. 深度剖面 释义: 全部,深度剖面,深度剖面图
网络释义 1. 深度剖面分析 ...( Bulk Analysis) , 近年来 辉光深度剖面分析(Depth Profile Analysis) 技术被应用于 材料表面分析领域而日益受到人们的重视 ... wenku.baidu.com|基于3个网页 2. 深度逐层分析 ... ) lay-er-by-layer analysis 逐层成分分析 )depth profile analysis深度逐层分析) Puff-by-...
The adaptive kernel method leads to the simplest depth profile consistent with the data. Erosion and redeposition rates of carbon divertor plates in the fusion experiment ASDEX Upgrade could be determined by RBS-analysis of thin film probes before and after exposition to plasma discharges.Toussaint,...
It was found that cyclic nanoindentation is a reproducible technique enabling reliable construction of the depth profile of mechanical properties to the same degree of accuracy as conventional nanoindentation but considerably faster. The Young's modulus (7.9–17GPa) and hardness (0.69–3.0GPa) of ...
Persistent and emerging organic pollutants were sampled in September 2012 and 2013 at a sampling site in front of the Three Gorges Dam near Maoping (China) in a water depth between 11 and 61 m to generate a depth profile of analytes. A novel compact water sampling system with self-packed ...
respectively. Sequences characteristic to these proteins were manually assigned in situ in the skin layers where they are known to be present exclusively or predominantly. The layers of the skin in the depth profile, specifically thestratum corneum, underlying epidermis and dermis, were assigned based...
For these types of sensitive samples the use of angle resolved X-ray photoelectron spectroscopy (ARXPS) may be helpful in providing a non-destructive depth profile of the near surface layer. ARXPS is accomplished by tilting the sample to vary the angle between the axis of the photoelectron ...
ARTICLE Received 7 Nov 2014 | Accepted 5 Jun 2015 | Published 13 Jul 2015 DOI: 10.1038/ncomms8745 OPEN Quantitative operando visualization of the energy band depth profile in solar cells Qi Chen1,2, Lin Mao1, Yaowen Li1,3, Tao Kong4, Na Wu5, Changqi Ma5, Sai Bai6, Yizheng Jin6,...
Interpretation of TOF-SIMS depth profile from ultrashow high- k dielectric stacks assisted by hybrid collisional computer simulation . Ignatova VA, Moller W... VA Ignatova,W. Mller,T Conard,... - 《Applied Physics A》 被引量: 5发表: 2005年 Bioimaging TOF-SIMS: High resolution 3D imaging ...